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Bienvenue sur la collection HAL du LARIS
Direction | Sébastien LAHAYE
Référent·e HAL | Marie-Françoise GÉRARD
Fichiers
468
Références
824
Proportion d'Open Access
45 %
Actualités du Laboratoire
Mots-Clés
Aging
Social cognition
Max-plus algebra
Parameter estimation
Computer vision
Performance
Monitoring
Stochastic resonance
Six Sigma
Fault detection
Nonlinear dynamics
Correlation
Réalité virtuelle
Convolutional neural network
Diagnosis
Reliability
Brain
Interval analysis
Algorithm
Interaction Techniques
Optimization
Complexity
Decoherence
Conducted immunity
Multiscale entropy
Accelerated degradation test
Thermal modeling
Control
Machine Learning
Control chart
Complex systems
Estimation
Data mining
State estimation
Inverse problem
Fiabilité
Diagnostic
Heat recovery
Bayesian inference
Entropy
Lean manufacturing
Virtual reality
Image analysis
Timed event graphs
Laser speckle contrast imaging
Imaging
Epilepsy
Gamma process
Degradation process
Inverse problems
Numerical simulation
Bayesian network
Older adults
Machine learning
Complexité
Identification
Degradation
Modeling
MATLAB
Fault diagnosis
Bayesian networks
Scheduling
Segmentation
Quantum noise
Stroke
Electroencephalography
Image processing
Petri nets
Max
Detection
Simulation
Cycle time
Accelerated tests
Discrete event systems
MRI
Durability
Empirical mode decomposition
Heat transfer
Quadratic assignment problem
Microcirculation
Accelerated testing
Irregularity
Optimisation
Cognition
Feature extraction
Graph matching
Data augmentation
Awake surgery
Prediction
Concrete
Texture
Classification
Quantum information
COVID-19
Partial differential equations
Sample entropy
Conjugate gradient method
Deep learning
Thermal comfort
Cerebral palsy
Publications des équipes de recherche du LARIS
SDO | Systèmes Dynamiques et Optimisation ISISV | Information, Signal, Image et Sciences du Vivant SFD | Sûreté de Fonctionnement et aide à la DécisionDernières parutions
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Jaber Al Rashid, Mohsen Koohestani, Laurent Saintis, Mihaela Barreau. Degradation and Reliability Modeling of EM Robustness of Voltage Regulators Based on ADT: An Approach and A Case Study. IEEE Transactions on Device and Materials Reliability, 2024, 24 (1), pp.2-13. ⟨10.1109/TDMR.2023.3340426⟩. ⟨hal-04334074⟩