Development of a Dedicated Optical System Fully Metrologically Traceable for Quantitative Film Dosimetry - Département Métrologie Instrumentation & Information Access content directly
Conference Papers Year : 2023

Development of a Dedicated Optical System Fully Metrologically Traceable for Quantitative Film Dosimetry

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Year Month Jours
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Wednesday, August 28, 2024
Embargoed file
0 3 8
Year Month Jours
Avant la publication
Wednesday, August 28, 2024
Embargoed file
0 3 8
Year Month Jours
Avant la publication
Wednesday, August 28, 2024
Embargoed file
Wednesday, August 28, 2024
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cea-04487908 , version 1 (04-03-2024)

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  • HAL Id : cea-04487908 , version 1

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Julien Jurczak, Benjamin Rapp. Development of a Dedicated Optical System Fully Metrologically Traceable for Quantitative Film Dosimetry. AAPM 65th Annual Meeting, Jul 2023, Houston, United States. ⟨cea-04487908⟩
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