"Hazard-free self-timed design: methodology and application", E. Senn, B. Zavidovique, Integrated Computer-Aided Engineering Journal, vol. 7, number 3/2000, IOS Press. - lab-STICC-UBS Accéder directement au contenu
Article Dans Une Revue Stress: The International Journal on the Biology of Stress Année : 2000

"Hazard-free self-timed design: methodology and application", E. Senn, B. Zavidovique, Integrated Computer-Aided Engineering Journal, vol. 7, number 3/2000, IOS Press.

Eric Senn (1)
Eric Senn
Lab-STICC_UBS_CACS_MOCS

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Micro et nanotechnologies/Microélectronique

Eric Senn  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-00083238

Soumis le : jeudi 29 juin 2006-21:51:48

Dernière modification le : vendredi 24 mars 2023-14:52:47

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hal-00083238 , version 1 (29-06-2006)

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  • HAL Id : hal-00083238 , version 1

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Eric Senn. "Hazard-free self-timed design: methodology and application", E. Senn, B. Zavidovique, Integrated Computer-Aided Engineering Journal, vol. 7, number 3/2000, IOS Press.. Stress: The International Journal on the Biology of Stress, 2000, x. ⟨hal-00083238⟩

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