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</div><div id="widget-8670" class="widget widget-domain"><h2 class="widget-header">Disciplines</h2><div class="widget-content"><div class="domains"> <div id="domain-graph" style=""></div> <div class="widget-footer"><a href="javascript:void(0);" onclick="displayDiv(this)">› Liste</a></div></div><div class="domains-list" style="display:none;"> <div class="overflow"><ul> <li><a href="/todri/primaryDomain_s/spi.nano">Sciences de l'ingénieur [physics]/Micro et nanotechnologies/Microélectronique <span class="badge badge-default">146</span></a></li> <li><a href="/todri/primaryDomain_s/spi.tron">Sciences de l'ingénieur [physics]/Electronique <span class="badge badge-default">24</span></a></li> <li><a href="/todri/primaryDomain_s/info.info-dl">Informatique [cs]/Bibliothèque électronique [cs.DL] <span class="badge badge-default">10</span></a></li> <li><a href="/todri/primaryDomain_s/spi">Sciences de l'ingénieur [physics] <span class="badge badge-default">7</span></a></li> <li><a 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href="/todri/keyword_s/%22Integrated+circuit+testing%22" class="keyword keyword-4">Integrated circuit testing</a> <a href="/todri/keyword_s/%22Power+supplies%22" class="keyword keyword-3">Power supplies</a> <a href="/todri/keyword_s/%22SRAM%22" class="keyword keyword-6">SRAM</a> <a href="/todri/keyword_s/%22SEU%22" class="keyword keyword-3">SEU</a> <a href="/todri/keyword_s/%22Magnetic+tunneling%22" class="keyword keyword-3">Magnetic tunneling</a> <a href="/todri/keyword_s/%22Neutrons%22" class="keyword keyword-3">Neutrons</a> <a href="/todri/keyword_s/%22Logic+gates%22" class="keyword keyword-3">Logic gates</a> <a href="/todri/keyword_s/%22Failure+analysis%22" class="keyword keyword-3">Failure analysis</a> <a href="/todri/keyword_s/%22Test%22" class="keyword keyword-3">Test</a> <a href="/todri/keyword_s/%22Integrated+circuits%22" class="keyword keyword-3">Integrated circuits</a> <a href="/todri/keyword_s/%22Automatic+test+pattern+generation%22" class="keyword keyword-3">Automatic test pattern generation</a> <a href="/todri/keyword_s/%22Carbon+nanotubes%22" class="keyword keyword-5">Carbon nanotubes</a> <a href="/todri/keyword_s/%22Integrated+circuit+modeling%22" class="keyword keyword-5">Integrated circuit modeling</a> <a href="/todri/keyword_s/%22Through-silicon+vias%22" class="keyword keyword-4">Through-silicon vias</a> <a href="/todri/keyword_s/%22Delays%22" class="keyword keyword-4">Delays</a> <a href="/todri/keyword_s/%22Transistors%22" class="keyword keyword-3">Transistors</a> <a href="/todri/keyword_s/%22Integrated+circuit+interconnections%22" class="keyword keyword-3">Integrated circuit interconnections</a> <div class="widget-footer"><a href="javascript:void(0);" onclick="displayDiv(this)">› Liste complète</a></div></div><div class="keywords-list" style="display:none;"> <div class="overflow"><ul> <li><a href="/todri/keyword_s/%22SRAM%22" >SRAM <span class="badge badge-default">14</span></a></li> <li><a href="/todri/keyword_s/%22Carbon+nanotubes%22" >Carbon nanotubes <span class="badge badge-default">10</span></a></li> <li><a href="/todri/keyword_s/%22Integrated+circuit+modeling%22" >Integrated circuit modeling <span class="badge badge-default">10</span></a></li> <li><a href="/todri/keyword_s/%22Delays%22" >Delays <span class="badge badge-default">8</span></a></li> <li><a href="/todri/keyword_s/%22Integrated+circuit+testing%22" >Integrated circuit testing <span class="badge badge-default">8</span></a></li> <li><a href="/todri/keyword_s/%22Through-silicon+vias%22" >Through-silicon vias <span class="badge badge-default">8</span></a></li> <li><a href="/todri/keyword_s/%22Circuit+faults%22" >Circuit faults <span class="badge badge-default">7</span></a></li> <li><a href="/todri/keyword_s/%22Transistors%22" >Transistors <span class="badge badge-default">7</span></a></li> <li><a href="/todri/keyword_s/%223D+integration%22" >3D integration <span class="badge badge-default">6</span></a></li> <li><a href="/todri/keyword_s/%22Integrated+circuit+interconnections%22" >Integrated circuit interconnections <span class="badge badge-default">6</span></a></li> <li><a href="/todri/keyword_s/%22SEU%22" >SEU <span class="badge badge-default">6</span></a></li> <li><a href="/todri/keyword_s/%22Test%22" >Test <span class="badge badge-default">6</span></a></li> <li><a href="/todri/keyword_s/%22Automatic+test+pattern+generation%22" >Automatic test pattern generation <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22Failure+analysis%22" >Failure analysis <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22Integrated+circuits%22" >Integrated circuits <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22Logic+gates%22" >Logic gates <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22Magnetic+tunneling%22" >Magnetic tunneling <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22Neutrons%22" >Neutrons <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22Noise%22" >Noise <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22Power+supplies%22" >Power supplies <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22Radiation%22" >Radiation <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22Reliability%22" >Reliability <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22SER%22" >SER <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22Switches%22" >Switches <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22Three-dimensional+displays%22" >Three-dimensional displays <span class="badge badge-default">5</span></a></li> <li><a href="/todri/keyword_s/%22Analytical+models%22" >Analytical models <span class="badge badge-default">4</span></a></li> <li><a href="/todri/keyword_s/%22Integrated+circuit+reliability%22" >Integrated circuit reliability <span class="badge badge-default">4</span></a></li> <li><a href="/todri/keyword_s/%22Low-power+design%22" >Low-power design <span class="badge badge-default">4</span></a></li> <li><a href="/todri/keyword_s/%22Memory+test%22" >Memory test <span class="badge badge-default">4</span></a></li> <li><a href="/todri/keyword_s/%22Power+supply+noise%22" >Power supply noise <span class="badge badge-default">4</span></a></li> <li><a href="/todri/keyword_s/%22Soft+errors%22" >Soft errors <span class="badge badge-default">4</span></a></li> <li><a href="/todri/keyword_s/%22Three-dimensional+integrated+circuits%22" >Three-dimensional integrated circuits <span class="badge badge-default">4</span></a></li> <li><a href="/todri/keyword_s/%223D%22" >3D <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Computer+architecture%22" >Computer architecture <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Copper%22" >Copper <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Cross-section%22" >Cross-section <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Design%22" >Design <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Electromigration%22" >Electromigration <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Electrothermal+analysis%22" >Electrothermal analysis <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Integrated+circuit+design%22" >Integrated circuit design <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Integrated+circuit+noise%22" >Integrated circuit noise <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Interconnects%22" >Interconnects <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Microprocessors%22" >Microprocessors <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Neutron%22" >Neutron <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Power+demand%22" >Power demand <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Process+variability%22" >Process variability <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Sensors%22" >Sensors <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Silicon%22" >Silicon <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Single+Event+Upset%22" >Single Event Upset <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Temperature+distribution%22" >Temperature distribution <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Through-silicon-vias%22" >Through-silicon-vias <span class="badge badge-default">3</span></a></li> <li><a href="/todri/keyword_s/%22Advanced+PMA+STT-MRAM%22" >Advanced PMA STT-MRAM <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Atmospheric+neutrons%22" >Atmospheric neutrons <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Automatic+test+pattern+generation+ATPG%22" >Automatic test pattern generation ATPG <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22CMOS+memory+circuits%22" >CMOS memory circuits <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22COTS%22" >COTS <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Capacitors%22" >Capacitors <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Carbon+nanotube%22" >Carbon nanotube <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Carbon+nanotube+CNT%22" >Carbon nanotube CNT <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Carbon+nanotube+interconnects%22" >Carbon nanotube interconnects <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Circuits%22" >Circuits <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Clocks%22" >Clocks <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Correlation%22" >Correlation <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Critical+path+delay%22" >Critical path delay <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Cu-CNT+composites%22" >Cu-CNT composites <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Defects%22" >Defects <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Delay+variation%22" >Delay variation <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Design+for+testability%22" >Design for testability <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Digital+electronic+circuits%22" >Digital electronic circuits <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Discharges+electric%22" >Discharges electric <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Error+analysis%22" >Error analysis <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Fault+diagnosis%22" >Fault diagnosis <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Fault+modeling%22" >Fault modeling <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Fault+tolerance%22" >Fault tolerance <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Ground+bounce%22" >Ground bounce <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22H4IRRAD%22" >H4IRRAD <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Heating%22" >Heating <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Human+movement+detection%22" >Human movement detection <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22IR-drop%22" >IR-drop <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22ITC%2799+benchmark+circuits%22" >ITC'99 benchmark circuits <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Integrated+circuit+modelling%22" >Integrated circuit modelling <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Interconnect%22" >Interconnect <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Low+power%22" >Low power <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22MRAM+devices%22" >MRAM devices <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Measurement%22" >Measurement <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Mixed+particle+fields%22" >Mixed particle fields <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Monitoring%22" >Monitoring <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Monte+Carlo+simulation%22" >Monte Carlo simulation <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Multi-walled+carbon+nanotubes%22" >Multi-walled carbon nanotubes <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22On-chip+interconnect%22" >On-chip interconnect <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22On-chip+power+distribution+networks%22" >On-chip power distribution networks <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22PVT+variations%22" >PVT variations <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Particle+accelerators%22" >Particle accelerators <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Path+delay+variations%22" >Path delay variations <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Perpendicular+magnetic+anisotropy%22" >Perpendicular magnetic anisotropy <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Power+consumption%22" >Power consumption <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Power+delivery%22" >Power delivery <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Power+grids%22" >Power grids <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Power+mode+control+logic%22" >Power mode control logic <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Power+supply%22" >Power supply <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Power+supply+circuits%22" >Power supply circuits <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Power+switch%22" >Power switch <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Power+switches%22" >Power switches <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Random+access+memory%22" >Random access memory <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Resonant+frequency%22" >Resonant frequency <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22SPICE%22" >SPICE <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22SRAM+Cell%22" >SRAM Cell <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22SRAM+cells%22" >SRAM cells <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22SRAM+chips%22" >SRAM chips <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22STT-MRAM%22" >STT-MRAM <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Smart+wearable+for+health+monitoring%22" >Smart wearable for health monitoring <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Solid+modeling%22" >Solid modeling <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Spintronics%22" >Spintronics <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Steady-state%22" >Steady-state <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Switching+circuits%22" >Switching circuits <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Switching+frequency%22" >Switching frequency <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22System-on-chip%22" >System-on-chip <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22TSVs%22" >TSVs <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Thermal+analysis%22" >Thermal analysis <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Thermal+resistance%22" >Thermal resistance <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Three-dimensional+integration%22" >Three-dimensional integration <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Threshold+voltage%22" >Threshold voltage <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Toggle+MRAM%22" >Toggle MRAM <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Tunneling+magnetoresistance%22" >Tunneling magnetoresistance <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%22Variability%22" >Variability <span class="badge badge-default">2</span></a></li> <li><a href="/todri/keyword_s/%221D%2F2D+nanomaterials%22" >1D/2D nanomaterials <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%223D+IC+reliability%22" >3D IC reliability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%223D+ICs%22" >3D ICs <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%223D+MPSoCs%22" >3D MPSoCs <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%223D+NoC%22" >3D NoC <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%223D+NoCs%22" >3D NoCs <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%223D+integrated+circuit+test%22" >3D integrated circuit test <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%223D+integration+technology%22" >3D integration technology <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%223D+interconnects%22" >3D interconnects <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%223D+manufacture+variability%22" >3D manufacture variability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%223D+network-on-chip%22" >3D network-on-chip <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%223D+networks-on-chip%22" >3D networks-on-chip <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%223D-IC+reliability%22" >3D-IC reliability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%226T+SRAM+Cell%22" >6T SRAM Cell <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22ATLAS+trigger+system%22" >ATLAS trigger system <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22ATPG%22" >ATPG <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Adaptive+Test%22" >Adaptive Test <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Adaptive+routing%22" >Adaptive routing <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Adaptive+source+bias%22" >Adaptive source bias <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Adiabatic+Logic%22" >Adiabatic Logic <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Algorithm+design+and+analysis%22" >Algorithm design and analysis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Alpha+particles%22" >Alpha particles <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Antarctica%22" >Antarctica <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Antenna+measurements%22" >Antenna measurements <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Applied+test+set%22" >Applied test set <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Array+structure+level%22" >Array structure level <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Arrays%22" >Arrays <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Asynchronous+communication+interfaces%22" >Asynchronous communication interfaces <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Atmospheric+Neutron%22" >Atmospheric Neutron <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Automatic+test+pattern+generation+test+methods%22" >Automatic test pattern generation test methods <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22B-jet+online+selections%22" >B-jet online selections <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Backtrace+X-filling+approach%22" >Backtrace X-filling approach <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Bonding%22" >Bonding <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22CACTI%22" >CACTI <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22CMOS%22" >CMOS <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22CMOS+integrated+circuits%22" >CMOS integrated circuits <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22CMOS+logic+circuits%22" >CMOS logic circuits <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22CMOS+technology%22" >CMOS technology <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22CNT%22" >CNT <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22CNT+dispersion%22" >CNT dispersion <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22CNTs%22" >CNTs <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22CPT%22" >CPT <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Cache+storage%22" >Cache storage <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Calibration%22" >Calibration <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Capacitance%22" >Capacitance <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Capacitive+defects%22" >Capacitive defects <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Capacitor+switching%22" >Capacitor switching <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Carbon+nanotube+field+effect+transistors+CNTFET%22" >Carbon nanotube field effect transistors CNTFET <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Carbon+nanotubes+CNTs%22" >Carbon nanotubes CNTs <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Cell+library+characterization%22" >Cell library characterization <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Charge+transfer+doping%22" >Charge transfer doping <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Chip+performance%22" >Chip performance <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Circuit%22" >Circuit <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Circuit+simulation%22" >Circuit simulation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Circuits+and+systems%22" >Circuits and systems <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Close-form+mathematical+model%22" >Close-form mathematical model <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Combinational+circuits%22" >Combinational circuits <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Combinational+logic%22" >Combinational logic <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Combinational+logic+protection%22" >Combinational logic protection <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Commercial+ATPG+tools%22" >Commercial ATPG tools <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Compact+model%22" >Compact model <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Complete+resistive-open+defect+analysis%22" >Complete resistive-open defect analysis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Complex+algorithms%22" >Complex algorithms <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Comprehensive+evaluation+framework%22" >Comprehensive evaluation framework <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Computational+cost+reduction%22" >Computational cost reduction <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Computing-in-memory+CIM%22" >Computing-in-memory CIM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Concordia%22" >Concordia <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Concurrent+variability%22" >Concurrent variability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Conductivity%22" >Conductivity <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Conductors%22" >Conductors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Contact+resistance%22" >Contact resistance <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Continuous+device+scaling%22" >Continuous device scaling <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Continuous+scaling%22" >Continuous scaling <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Core+cell+level%22" >Core cell level <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Core+cell+transistors%22" >Core cell transistors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Core+cells%22" >Core cells <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Core-cells%22" >Core-cells <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Couplings%22" >Couplings <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Critical+paths%22" >Critical paths <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Crosstalk%22" >Crosstalk <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Current+Emulation%22" >Current Emulation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Current+densities%22" >Current densities <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Current+density%22" >Current density <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Current+flow+direction%22" >Current flow direction <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22DC-DC+power+converters%22" >DC-DC power converters <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22DFT%22" >DFT <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Databases%22" >Databases <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Decap%22" >Decap <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Decision+support+systems%22" >Decision support systems <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Decoupling+capacitor%22" >Decoupling capacitor <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Decoupling+capacitor+effectiveness%22" >Decoupling capacitor effectiveness <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Deep+submicrometer%22" >Deep submicrometer <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Defect+coverage%22" >Defect coverage <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Defective+SWCNT%22" >Defective SWCNT <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Defective+TSV%22" >Defective TSV <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Defective+TSVs%22" >Defective TSVs <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Defective+resistance%22" >Defective resistance <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Delay%22" >Delay <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Delay+circuits%22" >Delay circuits <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Delay+defect+coverage%22" >Delay defect coverage <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Delay+defects%22" >Delay defects <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Delay+distribution%22" >Delay distribution <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Delay+fault+coverage%22" >Delay fault coverage <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Delay+probability+metric%22" >Delay probability metric <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Delay+test%22" >Delay test <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Density+Functional+Theory+DFT%22" >Density Functional Theory DFT <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Design+for+Test+%26+Diagnosis%22" >Design for Test & Diagnosis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Detector+design+and+construction+technologies+and+materials%22" >Detector design and construction technologies and materials <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Detectors%22" >Detectors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Device%22" >Device <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Diagnosis%22" >Diagnosis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Diagnosis+accuracy%22" >Diagnosis accuracy <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Diagnostics%22" >Diagnostics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Dictionaries%22" >Dictionaries <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Differential+bit+line+voltage+analysis%22" >Differential bit line voltage analysis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Doped+CNT%22" >Doped CNT <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Doped+SWCNT%22" >Doped SWCNT <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Double-cell+faulty+behavior%22" >Double-cell faulty behavior <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Dust+contamination%22" >Dust contamination <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Dynamic+mode%22" >Dynamic mode <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22EM+effect%22" >EM effect <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Effect-Cause+approach%22" >Effect-Cause approach <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Electrical+conditions%22" >Electrical conditions <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Electrical+modeling%22" >Electrical modeling <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Electrical+properties%22" >Electrical properties <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Electrical+properties+of+doped+CNT%22" >Electrical properties of doped CNT <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Electrical+simulation%22" >Electrical simulation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Electrical+simulations%22" >Electrical simulations <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Electro-thermal+coupling%22" >Electro-thermal coupling <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Electronic+device%22" >Electronic device <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Elementary+particle+jets%22" >Elementary particle jets <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Elevated+power+consumption%22" >Elevated power consumption <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Elevators%22" >Elevators <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Emerging+technologies%22" >Emerging technologies <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Energy+efficiency%22" >Energy efficiency <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Estimation%22" >Estimation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22FPGA%22" >FPGA <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Fabrication+process%22" >Fabrication process <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Failure+Probability+Estimation%22" >Failure Probability Estimation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Failure+probability%22" >Failure probability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Fasttrack+real+time+processor%22" >Fasttrack real time processor <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Fault+detection%22" >Fault detection <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Fault+models%22" >Fault models <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Fault+simulation%22" >Fault simulation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Fault+tolerant+systems%22" >Fault tolerant systems <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Fault-tolerant+architecture%22" >Fault-tolerant architecture <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Fermi+level%22" >Fermi level <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Field+effect+biosensing%22" >Field effect biosensing <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Field+programmable+gate+arrays%22" >Field programmable gate arrays <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Field-effect+transistors%22" >Field-effect transistors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Flexible+electronics%22" >Flexible electronics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Flip-flops%22" >Flip-flops <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Fluctuations%22" >Fluctuations <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Functional+and+Structural+test%22" >Functional and Structural test <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Functional+metrics%22" >Functional metrics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Functional+program%22" >Functional program <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Functionalization%22" >Functionalization <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22GOx+immobilization%22" >GOx immobilization <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Gate+level%22" >Gate level <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Global+interconnect+scaling+problem%22" >Global interconnect scaling problem <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Glucose+sensor%22" >Glucose sensor <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Graphene%22" >Graphene <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Ground+bounce+distribution%22" >Ground bounce distribution <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Ground+grid+networks%22" >Ground grid networks <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Hard+errors%22" >Hard errors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Hardware+overheads%22" >Hardware overheads <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Heat+sinks%22" >Heat sinks <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Heavy+ions%22" >Heavy ions <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Heavy+tau+leptons%22" >Heavy tau leptons <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Helix+parameters%22" >Helix parameters <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Heuristic+algorithms%22" >Heuristic algorithms <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Heuristic+workload+assignment+algorithm%22" >Heuristic workload assignment algorithm <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Hierarchical+models%22" >Hierarchical models <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22High+density+integration%22" >High density integration <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22High-integration+density%22" >High-integration density <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Homogeneous+3D+MPSoC%22" >Homogeneous 3D MPSoC <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Human-robotic+interaction%22" >Human-robotic interaction <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Hypothetical+16+word+TAS-MRAM+architecture%22" >Hypothetical 16 word TAS-MRAM architecture <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22IBoX%22" >IBoX <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22IC%22" >IC <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22ICs%22" >ICs <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22IP+networks%22" >IP networks <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22ITC+99+benchmark+circuit%22" >ITC 99 benchmark circuit <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22ITC%2799+benchmarks%22" >ITC'99 benchmarks <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Image+color+analysis%22" >Image color analysis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Impedance%22" >Impedance <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Implementation+of+nano-scaled+CMOS+electronics%22" >Implementation of nano-scaled CMOS electronics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22In-plane+magnetic+anisotropy+effect%22" >In-plane magnetic anisotropy effect <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Inductance%22" >Inductance <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Input+pattern+ranking%22" >Input pattern ranking <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Input+test+patterns%22" >Input test patterns <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Integrated+circuit+manufacture%22" >Integrated circuit manufacture <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Integrated+circuit+packaging%22" >Integrated circuit packaging <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Integration%22" >Integration <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Interconnect+material%22" >Interconnect material <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Intra-cell+defect%22" >Intra-cell defect <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Intra-cell+defect+grading+tool%22" >Intra-cell defect grading tool <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Intra-cell+defects%22" >Intra-cell defects <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Intra-cell+diagnosis%22" >Intra-cell diagnosis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Intra-cell+diagnosis+resolution%22" >Intra-cell diagnosis resolution <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Isolated+leptons%22" >Isolated leptons <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Iterative+methods%22" >Iterative methods <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Jitter%22" >Jitter <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Jitter+based+power+supply+noise+sensor%22" >Jitter based power supply noise sensor <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Joint+probability%22" >Joint probability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22LHC+luminosity%22" >LHC luminosity <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Lab-on-chip%22" >Lab-on-chip <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Large+Hadron+Collider%22" >Large Hadron Collider <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Levelized+simulation%22" >Levelized simulation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Libraries%22" >Libraries <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Logic+diagnosis%22" >Logic diagnosis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Low+Power+SRAM%22" >Low Power SRAM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Low-power+SRAM%22" >Low-power SRAM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22MIPS+microprocessor%22" >MIPS microprocessor <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22MOSFET%22" >MOSFET <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Magnetic+domains%22" >Magnetic domains <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Magnetic+random+access+memory%22" >Magnetic random access memory <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Magnetic+separation%22" >Magnetic separation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Magnetic+storage%22" >Magnetic storage <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Magnetic+switching%22" >Magnetic switching <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Magnetic+tunnel+junction+MTJ%22" >Magnetic tunnel junction MTJ <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Magnetization%22" >Magnetization <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Manufacturing+defect%22" >Manufacturing defect <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Manufacturing+variability%22" >Manufacturing variability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Materials%22" >Materials <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Mean+time+to+failure%22" >Mean time to failure <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Memory+architecture%22" >Memory architecture <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Memory+blocks%22" >Memory blocks <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Memory+wall%22" >Memory wall <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Memristors%22" >Memristors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Metals%22" >Metals <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Microelectronics%22" >Microelectronics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Microprocessor%22" >Microprocessor <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Microprocessor+chips%22" >Microprocessor chips <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Misalignment%22" >Misalignment <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Mixed+Particle+Fields%22" >Mixed Particle Fields <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Mixed+field+radiation%22" >Mixed field radiation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Model+order+reduction%22" >Model order reduction <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Modelling%22" >Modelling <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Monitor%22" >Monitor <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Mono-vacancy+defects%22" >Mono-vacancy defects <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Monolithic+3D%22" >Monolithic 3D <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Multi-aggressor+crosstalk%22" >Multi-aggressor crosstalk <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Multi-scale+simulation%22" >Multi-scale simulation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Multiaggressor+crosstalk%22" >Multiaggressor crosstalk <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Multiple+TSVs%22" >Multiple TSVs <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Multiple+cell+upsets+MCUs%22" >Multiple cell upsets MCUs <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Multiprocessing+systems%22" >Multiprocessing systems <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Multivariate+statistics%22" >Multivariate statistics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Muon+isolation%22" >Muon isolation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Muons%22" >Muons <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22NVSim%22" >NVSim <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Nanodevices%22" >Nanodevices <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Nanoelectronics%22" >Nanoelectronics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Nanoscale+devices%22" >Nanoscale devices <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Nanotube%22" >Nanotube <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Network+routing%22" >Network routing <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Network+topology%22" >Network topology <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Network-on-chip%22" >Network-on-chip <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Neutron+irradiation%22" >Neutron irradiation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Neutron+radiation%22" >Neutron radiation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Nodal+analysis+formulation%22" >Nodal analysis formulation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Node+clustering+reduction%22" >Node clustering reduction <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Node+reduction+strategy%22" >Node reduction strategy <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Noise+reduction%22" >Noise reduction <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Noisy+Intermediate-Scale+Quantum+NISQ+Hardware%22" >Noisy Intermediate-Scale Quantum NISQ Hardware <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Non-volatile+memories%22" >Non-volatile memories <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Nonvolatile+memories+NVM%22" >Nonvolatile memories NVM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Nonvolatile+memory+NVM%22" >Nonvolatile memory NVM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Nuclear+electronics%22" >Nuclear electronics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Observability%22" >Observability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Off-chip%22" >Off-chip <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22On-+chip+power+distribution+networks%22" >On- chip power distribution networks <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22On-chip%22" >On-chip <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22On-chip+cache+design%22" >On-chip cache design <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22On-chip+power+distribution+network%22" >On-chip power distribution network <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22One-dimensional+materials%22" >One-dimensional materials <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Online+self-healing+circuit%22" >Online self-healing circuit <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Open+defective+TSV%22" >Open defective TSV <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22PCRAM%22" >PCRAM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22PD+issues%22" >PD issues <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22PDAPG+method%22" >PDAPG method <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22PSN+estimation+method%22" >PSN estimation method <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22PSN+sensor%22" >PSN sensor <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Parametric+analysis%22" >Parametric analysis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Partially+asynchronous+3D+NoCs%22" >Partially asynchronous 3D NoCs <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Partially+connected+3D+NoC%22" >Partially connected 3D NoC <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Particle+Accelerators%22" >Particle Accelerators <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Particle+beams%22" >Particle beams <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Particle+detector%22" >Particle detector <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Particle+detectors%22" >Particle detectors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Path+delay+ATPG+test+methods%22" >Path delay ATPG test methods <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Path+delay+patterns%22" >Path delay patterns <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Path+delay+testing%22" >Path delay testing <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Path+delay+variation%22" >Path delay variation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Pattern+selection%22" >Pattern selection <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Performance%22" >Performance <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Peripheral+circuitry%22" >Peripheral circuitry <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Permanent+faults%22" >Permanent faults <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Permeability%22" >Permeability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Perpendicular+magnetic+anisotropy+STT-MRAM%22" >Perpendicular magnetic anisotropy STT-MRAM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Phase+change+RAM%22" >Phase change RAM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Phase+change+random+access+memory%22" >Phase change random access memory <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Physical+design+aware+pattern+generation+method%22" >Physical design aware pattern generation method <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Physical+design+data%22" >Physical design data <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Physical+design+issues%22" >Physical design issues <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Piezoelectric+biosensor%22" >Piezoelectric biosensor <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Pins%22" >Pins <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Pipeline+structures%22" >Pipeline structures <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Pipelined+microprocessor+cores%22" >Pipelined microprocessor cores <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Pipelines%22" >Pipelines <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Pixel%22" >Pixel <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Planar+circuits%22" >Planar circuits <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Point-of-care%22" >Point-of-care <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Poles+and+towers%22" >Poles and towers <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Position+sensitive+particle+detectors%22" >Position sensitive particle detectors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Post-CMOS+devices%22" >Post-CMOS devices <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+Aware+Test%22" >Power Aware Test <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+Efficiency%22" >Power Efficiency <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+Management%22" >Power Management <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+Supply+Noise+Sensor%22" >Power Supply Noise Sensor <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+Switch%22" >Power Switch <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+aware+test%22" >Power aware test <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+budget%22" >Power budget <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+capacitors%22" >Power capacitors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+delivery+network+PDN%22" >Power delivery network PDN <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+efficiency%22" >Power efficiency <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+efficient+devices%22" >Power efficient devices <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+gating%22" >Power gating <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+gating+technique%22" >Power gating technique <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+grid+electrothermal+analysis%22" >Power grid electrothermal analysis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+grid+networks%22" >Power grid networks <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+integrated+circuits%22" >Power integrated circuits <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+measurement%22" >Power measurement <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+semiconductor+switches%22" >Power semiconductor switches <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+supply+noise+PSN%22" >Power supply noise PSN <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power+wall+issue%22" >Power wall issue <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power-Clock+Distribution+Network%22" >Power-Clock Distribution Network <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power-aware+test%22" >Power-aware test <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Power-supply+noise%22" >Power-supply noise <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Pre-computed+linearized+fitting+constants%22" >Pre-computed linearized fitting constants <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Principal+component+analysis%22" >Principal component analysis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Printed+electronics%22" >Printed electronics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Probability%22" >Probability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Probability+density+function%22" >Probability density function <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Process+variations%22" >Process variations <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Process+variations+PV%22" >Process variations PV <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Protons%22" >Protons <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Quantization+signal%22" >Quantization signal <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Quantum+Computing%22" >Quantum Computing <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Quantum+chromodynamics%22" >Quantum chromodynamics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Quantum+computing%22" >Quantum computing <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Qubit+mapping%22" >Qubit mapping <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Radmon%22" >Radmon <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Random+process+variability%22" >Random process variability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Random+variability%22" >Random variability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22ReRAM%22" >ReRAM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Read+Assist%22" >Read Assist <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Read+and+write+operation%22" >Read and write operation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Read+operation%22" >Read operation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Read+reliability%22" >Read reliability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Readout+electronics%22" >Readout electronics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Real+time+systems%22" >Real time systems <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Real-time+data+reduction%22" >Real-time data reduction <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Real-time+monitoring%22" >Real-time monitoring <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Redundancy%22" >Redundancy <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Regulators%22" >Regulators <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Reliability+engineering%22" >Reliability engineering <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Resistance+heating%22" >Resistance heating <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Resistive+RAM%22" >Resistive RAM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Resistive+defective+TSV%22" >Resistive defective TSV <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Resistive+open+TSV%22" >Resistive open TSV <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Resistive+open+defect%22" >Resistive open defect <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Resistive+open+defects%22" >Resistive open defects <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Resistive-open+Defects%22" >Resistive-open Defects <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Resistive-open+TSVs%22" >Resistive-open TSVs <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Resistive-open+defect+coverage%22" >Resistive-open defect coverage <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Resistive-open+defect+impact+characterization%22" >Resistive-open defect impact characterization <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Resistive-open+defects%22" >Resistive-open defects <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Ring+oscillators%22" >Ring oscillators <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Roads%22" >Roads <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Routing%22" >Routing <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22SB-SI+method%22" >SB-SI method <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22SDF+detectability%22" >SDF detectability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22SDQL+metric%22" >SDQL metric <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22SNM%22" >SNM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22SPICE+simulation%22" >SPICE simulation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22SRAM+Memory%22" >SRAM Memory <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22SRAM+Test%22" >SRAM Test <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22SRAM+based+on-chip+cache%22" >SRAM based on-chip cache <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22SRAM+read+access+failures%22" >SRAM read access failures <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22SRAM+testing%22" >SRAM testing <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22STT-MRAM-based+architecture+level+evaluations%22" >STT-MRAM-based architecture level evaluations <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Saturation+magnetization%22" >Saturation magnetization <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Scaling+circuits%22" >Scaling circuits <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Self-heating%22" >Self-heating <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Sense+Amplifier%22" >Sense Amplifier <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Sense+amplifier+cell+system%22" >Sense amplifier cell system <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Sense+amplifier+core+cell+system%22" >Sense amplifier core cell system <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Sense+amplifiers%22" >Sense amplifiers <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Sensing+circuit%22" >Sensing circuit <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Sensor+device%22" >Sensor device <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Serial+communication%22" >Serial communication <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Serialization%22" >Serialization <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Silicone+rubber%22" >Silicone rubber <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Silver+nanowires%22" >Silver nanowires <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Simulated+annealing%22" >Simulated annealing <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Simulated-annealing-based+iterative+process%22" >Simulated-annealing-based iterative process <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Single+event+latchup+SEL%22" >Single event latchup SEL <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Small+delay+faults%22" >Small delay faults <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Small+delay+variations%22" >Small delay variations <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Small-delay+faults%22" >Small-delay faults <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Soft+Error+Rate%22" >Soft Error Rate <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Soft+robotics%22" >Soft robotics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Source-Biasing%22" >Source-Biasing <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Stastistical+simulation%22" >Stastistical simulation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Static+power+consumption%22" >Static power consumption <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Static+power+consumption+reduction%22" >Static power consumption reduction <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Statistical+delay+quality+level%22" >Statistical delay quality level <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Strain+sensors%22" >Strain sensors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Stretchable+piezoresistive+strain+sensors%22" >Stretchable piezoresistive strain sensors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Stretchable+strain+sensors%22" >Stretchable strain sensors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Structural+metrics%22" >Structural metrics <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Supply+noise%22" >Supply noise <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Supply+noise+SN%22" >Supply noise SN <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Supply+voltage+control%22" >Supply voltage control <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Switched+capacitor+circuits%22" >Switched capacitor circuits <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Switched+capacitor+networks%22" >Switched capacitor networks <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Switching+circuit%22" >Switching circuit <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22System+performance%22" >System performance <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Systems%22" >Systems <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22TAS-MRAM%22" >TAS-MRAM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22TSV+aware+timing+analysis%22" >TSV aware timing analysis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22TSV+electromigration%22" >TSV electromigration <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22TSV+fault%22" >TSV fault <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22TSV+probabilistic+delay+distributions%22" >TSV probabilistic delay distributions <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22TSV+propagation+delays%22" >TSV propagation delays <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22TSV+testing+quality%22" >TSV testing quality <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Task+scheduling+algorithm%22" >Task scheduling algorithm <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Tau-jets%22" >Tau-jets <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Technologies+%C3%A9mergentes%22" >Technologies émergentes <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Technology%22" >Technology <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Technology+node+shrinking%22" >Technology node shrinking <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Telecommunication+traffic%22" >Telecommunication traffic <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Temperature%22" >Temperature <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Temperature+dependence%22" >Temperature dependence <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Temperature+measurement%22" >Temperature measurement <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Temperature+sensors%22" >Temperature sensors <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Temperature+variation%22" >Temperature variation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Tera-scale+integrated+circuits%22" >Tera-scale integrated circuits <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Test+algorithm%22" >Test algorithm <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Test+algorithms%22" >Test algorithms <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Test+efficiency%22" >Test efficiency <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Test+pattern+generation%22" >Test pattern generation <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Test+pattern+generators%22" >Test pattern generators <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Test+patterns%22" >Test patterns <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Test+power%22" >Test power <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Test+quality%22" >Test quality <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Test+solutions%22" >Test solutions <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Testing%22" >Testing <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Thermal+fluctuations%22" >Thermal fluctuations <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Thermal+management+packaging%22" >Thermal management packaging <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Thermal+modeling%22" >Thermal modeling <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Thermal+stability%22" >Thermal stability <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Thermally+assisted+switching+MRAM%22" >Thermally assisted switching MRAM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Thermally+assisted+switching+TAS-MRAM%22" >Thermally assisted switching TAS-MRAM <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Through+silicon+via%22" >Through silicon via <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Through+silicon+vias%22" >Through silicon vias <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Through-Silicon+vias%22" >Through-Silicon vias <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Through-Silicon+vias+TSV%22" >Through-Silicon vias TSV <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Tight-binding%22" >Tight-binding <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Timing+Uncertainty%22" >Timing Uncertainty <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Timing+analysis%22" >Timing analysis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Timing+aware+model%22" >Timing aware model <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Timing+uncertainty+measure%22" >Timing uncertainty measure <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Timing-aware+ATPG%22" >Timing-aware ATPG <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Timingo%22" >Timingo <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Tin%22" >Tin <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Topological+network+transformations%22" >Topological network transformations <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Transient+analysis%22" >Transient analysis <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Transient+and+permanent+faults%22" >Transient and permanent faults <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Transient+faults%22" >Transient faults <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Transistor+size%22" >Transistor size <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Transverse+momentum%22" >Transverse momentum <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Uncertainty+measure%22" >Uncertainty measure <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Uncorrelated+power+supply+noise%22" >Uncorrelated power supply noise <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Uniform+RLC+power%22" >Uniform RLC power <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Universal+on-chip+memory%22" >Universal on-chip memory <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Very+large+scale+integration%22" >Very large scale integration <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Void%22" >Void <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Voltage+control%22" >Voltage control <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Voltage+difference%22" >Voltage difference <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Voltage+distributions%22" >Voltage distributions <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Wearables%22" >Wearables <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Worst+case+path+delay%22" >Worst case path delay <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Write+Assist%22" >Write Assist <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Writing%22" >Writing <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22X-bit+filling%22" >X-bit filling <span class="badge badge-default">1</span></a></li> <li><a href="/todri/keyword_s/%22Yield%22" >Yield <span class="badge badge-default">1</span></a></li> </ul></div> <div class="widget-footer"><a href="javascript:void(0);" onclick="displayDiv(this)">› Nuage de mots</a></div></div></div></div><div id="widget-912" class="widget widget-revues"><h2 class="widget-header">Nom des revues</h2><div class="widget-content"><div class="revues"> <ul><li><a href="/todri/journalId_i/5404" >IEEE Transactions on Very Large Scale Integration (VLSI) Systems <span class="badge badge-default">10</span></a></li><li><a href="/todri/journalId_i/5372" >IEEE Transactions on Electron Devices <span class="badge badge-default">4</span></a></li><li><a href="/todri/journalId_i/70584" >ACM Journal on Emerging Technologies in Computing Systems <span class="badge badge-default">3</span></a></li><li><a href="/todri/journalId_i/14066" >IEEE Transactions on Nanotechnology <span class="badge badge-default">3</span></a></li><li><a href="/todri/journalId_i/5388" >IEEE Transactions on Nuclear Science <span class="badge badge-default">3</span></a></li><li><a href="/todri/journalId_i/29768" >Journal of Instrumentation <span class="badge badge-default">3</span></a></li><li><a href="/todri/journalId_i/108620" >Advanced Electronic Materials <span class="badge badge-default">1</span></a></li><li><a href="/todri/journalId_i/146498" >Biosensors <span class="badge badge-default">1</span></a></li><li><a href="/todri/journalId_i/14010" >IEEE Circuits and Systems Magazine -New Series- <span class="badge badge-default">1</span></a></li><li><a href="/todri/journalId_i/161786" >IEEE Transactions on Quantum Engineering <span class="badge badge-default">1</span></a></li></ul> <div class="widget-footer"><a href="javascript:void(0);" onclick="displayDiv(this)">› Liste complète</a></div></div><div class="revues-list" style="display:none;"> <div class="overflow"><ul><li><a href="/todri/journalId_i/5404" >IEEE Transactions on Very Large Scale Integration (VLSI) Systems <span class="badge badge-default">10</span></a></li><li><a href="/todri/journalId_i/5372" >IEEE Transactions on Electron Devices <span class="badge badge-default">4</span></a></li><li><a href="/todri/journalId_i/70584" >ACM Journal on Emerging Technologies in Computing Systems <span class="badge badge-default">3</span></a></li><li><a href="/todri/journalId_i/14066" >IEEE Transactions on Nanotechnology <span class="badge badge-default">3</span></a></li><li><a href="/todri/journalId_i/5388" >IEEE Transactions on Nuclear Science <span class="badge badge-default">3</span></a></li><li><a href="/todri/journalId_i/29768" >Journal of Instrumentation <span class="badge badge-default">3</span></a></li><li><a href="/todri/journalId_i/108620" >Advanced Electronic Materials <span class="badge badge-default">1</span></a></li><li><a href="/todri/journalId_i/146498" >Biosensors <span class="badge badge-default">1</span></a></li><li><a href="/todri/journalId_i/14010" >IEEE Circuits and Systems Magazine -New Series- <span class="badge badge-default">1</span></a></li><li><a href="/todri/journalId_i/161786" >IEEE Transactions on Quantum Engineering <span class="badge badge-default">1</span></a></li><li><a href="/todri/journalId_i/14072" >IEEE Transactions on Reliability <span class="badge badge-default">1</span></a></li><li><a href="/todri/journalId_i/12380" >International Journal of Circuit Theory and Applications <span class="badge badge-default">1</span></a></li><li><a href="/todri/journalId_i/15281" >Journal of Computer Science and Technology <span class="badge badge-default">1</span></a></li><li><a href="/todri/journalId_i/6534" >Journal of The Electrochemical Society <span class="badge badge-default">1</span></a></li><li><a href="/todri/journalId_i/17083" >Microelectronics Journal <span class="badge badge-default">1</span></a></li></ul></div> <div class="widget-footer"><a href="javascript:void(0);" onclick="displayDiv(this)">› Liste principale</a></div></div></div></div><div id="widget-9245" class="widget widget-years"><h2 class="widget-header">Année de production</h2><div class="widget-content"><div class="year"> <ul style=""><li><a href="/todri/producedDateY_i/2021" >2021 <span class="badge badge-default">2</span></a></li><li><a href="/todri/producedDateY_i/2020" >2020 <span class="badge badge-default">21</span></a></li><li><a href="/todri/producedDateY_i/2019" >2019 <span class="badge badge-default">16</span></a></li><li><a href="/todri/producedDateY_i/2018" >2018 <span class="badge badge-default">13</span></a></li><li><a href="/todri/producedDateY_i/2017" >2017 <span class="badge badge-default">16</span></a></li><li><a href="/todri/producedDateY_i/2016" >2016 <span class="badge badge-default">17</span></a></li><li><a href="/todri/producedDateY_i/2015" >2015 <span class="badge badge-default">14</span></a></li><li><a href="/todri/producedDateY_i/2014" >2014 <span class="badge badge-default">24</span></a></li><li><a href="/todri/producedDateY_i/2013" >2013 <span class="badge badge-default">28</span></a></li><li><a href="/todri/producedDateY_i/2012" >2012 <span class="badge badge-default">24</span></a></li></ul> <div class="widget-footer"><a href="javascript:void(0);" onclick="displayDiv(this)">› Liste complète</a></div></div><div class="year-list" style="display:none;"> <div class="overflow"><ul><li><a href="/todri/producedDateY_i/2021" >2021 <span class="badge badge-default">2</span></a></li><li><a href="/todri/producedDateY_i/2020" >2020 <span class="badge badge-default">21</span></a></li><li><a href="/todri/producedDateY_i/2019" >2019 <span class="badge badge-default">16</span></a></li><li><a href="/todri/producedDateY_i/2018" >2018 <span class="badge badge-default">13</span></a></li><li><a href="/todri/producedDateY_i/2017" >2017 <span class="badge badge-default">16</span></a></li><li><a href="/todri/producedDateY_i/2016" >2016 <span class="badge badge-default">17</span></a></li><li><a href="/todri/producedDateY_i/2015" >2015 <span class="badge badge-default">14</span></a></li><li><a href="/todri/producedDateY_i/2014" >2014 <span class="badge badge-default">24</span></a></li><li><a href="/todri/producedDateY_i/2013" >2013 <span class="badge badge-default">28</span></a></li><li><a href="/todri/producedDateY_i/2012" >2012 <span class="badge badge-default">24</span></a></li><li><a href="/todri/producedDateY_i/2011" >2011 <span class="badge badge-default">7</span></a></li><li><a href="/todri/producedDateY_i/2010" >2010 <span class="badge badge-default">4</span></a></li><li><a href="/todri/producedDateY_i/2009" >2009 <span class="badge badge-default">4</span></a></li><li><a href="/todri/producedDateY_i/2008" >2008 <span class="badge badge-default">2</span></a></li><li><a href="/todri/producedDateY_i/2007" >2007 <span class="badge badge-default">2</span></a></li><li><a href="/todri/producedDateY_i/2003" >2003 <span class="badge badge-default">1</span></a></li></ul></div> <div class="widget-footer"><a href="javascript:void(0);" onclick="displayDiv(this)">› Liste principale</a></div></div></div></div><div id="widget-9015" class="widget widget-europ"><h2 class="widget-header">Projets Européens</h2><div class="widget-content"><div class="europ"> <ul><li><a href="/todri/europeanProjectId_i/184516" >CarbON Nanotube compositE InterconneCTs <span class="badge badge-default">17</span></a></li><li><a href="/todri/europeanProjectId_i/712616" >Smart Autonomous MultiModal Sensors for Vital Signs Monitoring <span class="badge badge-default">7</span></a></li><li><a href="/todri/europeanProjectId_i/712916" >Two-Dimensional Oscillatory Neural Networks for Energy Efficient Neuromorphic Computing <span class="badge badge-default">5</span></a></li><li><a href="/todri/europeanProjectId_i/95540" >ENIAC ELESIS <span class="badge badge-default">3</span></a></li><li><a href="/todri/europeanProjectId_i/95531" >CATRENE ELESYS <span class="badge badge-default">1</span></a></li><li><a href="/todri/europeanProjectId_i/95538" >CATRENE TOETS <span class="badge badge-default">1</span></a></li><li><a href="/todri/europeanProjectId_i/135640" >European Library-based flow of Embedded Silicon and test Instruments <span class="badge badge-default">1</span></a></li></ul></div></div></div><div id="widget-3177" class="widget widget-anr"><h2 class="widget-header">Projets ANR</h2><div class="widget-content"><div class="anr"> <ul><li><a href="/todri/anrProjectId_i/42559" >Adiabatic Logic based on NEMS <span class="badge badge-default">1</span></a></li><li><a href="/todri/anrProjectId_i/45585" >Logique adiabatique à base de NEMS <span class="badge badge-default">1</span></a></li></ul></div></div></div><div id="widget-321" class="widget widget-idext"><h2 class="widget-header">Identifiants chercheur</h2><div class="widget-content"><ul><li> IdHAL : todri</li><li>ORCID : <a href="https://orcid.org/0000-0001-8573-2910" target="_blank">0000-0001-8573-2910</a></li><li>ResearcherId : <a href="http://www.researcherid.com/rid/M-5156-2013" target="_blank">M-5156-2013</a></li></ul></div></div> |
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<h1 style="word-wrap: break-word; max-width:85%;">Aida Todri-Sanial </h1> |
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<p>Website: <a href="https://www.lirmm.fr/~todri">https://www.lirmm.fr/~todri</a></p> |
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<h3 class="doc-header">Ouvrage (y compris édition critique et traduction)<small class="doc-nb">2 documents</small></h3> |
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Aida Todri-Sanial, Chuan Seng Tan. Physical Design for 3D Integrated Circuits. 397 p., 2015, Series: Devices, Circuits, and Systems, CRC Press, 9781498710367. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01444988">⟨lirmm-01444988⟩</a> </div> |
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Aida Todri-Sanial. Signal Integrity for SoC Design and Verification. California State University, Long Beach, 2003. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01254080">⟨lirmm-01254080⟩</a> </div> |
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<h3 class="doc-header">Chapitre d'ouvrage<small class="doc-nb">6 documents</small></h3> |
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Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Electromigration Alleviation Techniques for 3D Integrated Circuits. Chao Wang. <i>High Performance Computing for Big Data: Methodologies and Applications</i>, CRC Press, pp.37-58, 2017, 9781498783996. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01800220">⟨lirmm-01800220⟩</a> </div> |
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Aida Todri-Sanial. Exploring Carbon Nanotubes for 3D Power Delivery Networks. Aida Todri-Sanial; Jean Dijon; Antonio Maffuci. <i>Carbon Nanotubes for Interconnects</i>, CRC Press, pp.283-314, 2017, 978-3-319-29746-0. <a target="_blank" href="https://dx.doi.org/10.1007/978-3-319-29746-0_10">⟨10.1007/978-3-319-29746-0_10⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01445018">⟨lirmm-01445018⟩</a> </div> |
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Aida Todri-Sanial. Exploration of Carbon Nanotubes For Efficient Power Delivery. Saraju P. Mohanty; Ashok Srivastava. <i>Nano-CMOS and Post-CMOS Electronics: Devices and Modelling</i>, IET, pp.265-286, 2016, Chapter 9, 9781849199971 (print) 9781849199988 (online). <a target="_blank" href="https://dx.doi.org/10.1049/PBCS029E_ch9">⟨10.1049/PBCS029E_ch9⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01445053">⟨lirmm-01445053⟩</a> </div> |
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Aida Todri-Sanial. Lumped Electro-Thermal Modeling and Analysis of Carbon Nanotube Interconnects. Saraju P. Mohanty; Ashok Srivastava. <i>Nano-CMOS and Post-CMOS Electronics: Circuits and Design</i>, IET, pp.201-218, 2016, Chapter 7, 978-1-84919-999-5. <a target="_blank" href="https://dx.doi.org/10.1049/PBCS030E_ch7">⟨10.1049/PBCS030E_ch7⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01445070">⟨lirmm-01445070⟩</a> </div> |
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Aida Todri-Sanial. Overview of Physical Design Issues for 3D-Integrated Circuits. Aida Todri-Sanial; Chuan Seng Tan. <i>Physical Design for 3D Integrated Circuits</i>, CRC Press, pp.31-37, 2015, Chapter 2. PHYSICAL DESIGN METHODS FOR 3D INTEGRATION, 9781498710367. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01444992">⟨lirmm-01444992⟩</a> </div> |
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Aida Todri-Sanial. Design Methodology for 3D Power Delivery Networks. A. Todri-Sanial; Ch. Seng Tan. <i>Physical Design for 3D Integrated Circuits</i>, CRC Press, pp.30, 2015, Chapter 8, 9781498710367. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01445808">⟨lirmm-01445808⟩</a> </div> |
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<h3 class="doc-header">Pré-publication, Document de travail<small class="doc-nb">1 document</small></h3> |
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Reetu Raj Pandey, Jie Liang, Dilek Cakiroglu, Benoît Charlot, Aida Todri-Sanial. Electrochemical Glucose Sensor using Single-Wall Carbon Nanotube Field Effect Transistor. 2020. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02823189">⟨lirmm-02823189⟩</a> </div> |
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<h3 class="doc-header">Direction d'ouvrage, Proceedings, Dossier<small class="doc-nb">7 documents</small></h3> |
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Aida Todri-Sanial, Abhishek Singh Dahiya. Special Issue: Field Effect Transistor based Biosensing: Development and Applications. <i>Biosensors</i>, 2021. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03024023">⟨lirmm-03024023⟩</a> </div> |
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Sebastien Thuries, Aida Todri-Sanial. Special issue on Monolithic 3D: Technology, Design and Computing Systems Applications Perspectives. <i>ACM Journal on Emerging Technologies in Computing Systems</i>, 2021. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03024221">⟨lirmm-03024221⟩</a> </div> |
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Aida Todri-Sanial. Microelectronics Department Half-Day Seminar. 2019. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02388004">⟨lirmm-02388004⟩</a> </div> |
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Aida Todri-Sanial, Saraju Mohanty, Mariane Comte, Marc Belleville. Guest Editorial Special Issue on Nanoelectronic Circuit and System Design Methods for the Mobile Computing Era. <i>ACM Journal on Emerging Technologies in Computing Systems</i>, 13 (2), pp.Art 12, 2017, <a target="_blank" href="https://dx.doi.org/10.1145/3003370">⟨10.1145/3003370⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01795764">⟨lirmm-01795764⟩</a> </div> |
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Aida Todri-Sanial, Jean Dijon, Antonio Maffucci. Carbon nanotubes for Interconnects: Process, Design and Applications. Aida Todri-Sanial, Jean Dijon, Antonio Maffuci. France. <a target="_blank" href="http://www.springer.com/fr/book/9783319297446">Springer International Publishing</a>, 2017, 978-3-319-29744-6 (Print) 978-3-319-29746-0 (Online). <a target="_blank" href="https://dx.doi.org/10.1007/978-3-319-29746-0">⟨10.1007/978-3-319-29746-0⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01444977">⟨lirmm-01444977⟩</a> </div> |
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Krishnendu Chakrabarty, Massimo Alioto, Maxime Baas, Chirn Chye Boon, Meng-Fan Chang, et al.. Editorial in IEEE Transactions on Very Large Scale Integration (VLSI) Systems. France. <i>IEEE Transactions on Very Large Scale Integration (VLSI) Systems</i>, 25 (1), pp.1-20, 2017, <a target="_blank" href="https://dx.doi.org/10.1109/TVLSI.2016.2638578">⟨10.1109/TVLSI.2016.2638578⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01795772">⟨lirmm-01795772⟩</a> </div> |
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Aida Todri-Sanial, Giorgio Di Natale, Patrick Girard, Marc Belleville, Saraju P. Mohanty, et al.. Proceedings of IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2015). Jul 2015, Montpellier, France. 2015, 978-1-4799-8718-4. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01433587">⟨lirmm-01433587⟩</a> </div> |
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<h3 class="doc-header">HDR<small class="doc-nb">1 document</small></h3> |
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Aida Todri-Sanial. Design Space Exploration Of Emerging Technologies For Energy Efficiency. Digital Libraries [cs.DL]. University of Montpellier, 2014. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/tel-01255761">⟨tel-01255761⟩</a> </div> |
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<h3 class="doc-header">Article dans une revue<small class="doc-nb">31 documents</small></h3> |
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Abhishek Singh Dahiya, Thierry Gil, J Thireau, Nadine Azemard, Alain Lacampagne, et al.. 1D Nanomaterial‐Based Highly Stretchable Strain Sensors for Human Movement Monitoring and Human–Robotic Interactive Systems. <i>Advanced Electronic Materials</i>, Wiley, In press, <a target="_blank" href="https://dx.doi.org/10.1002/aelm.202000547">⟨10.1002/aelm.202000547⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02932782">⟨lirmm-02932782⟩</a> </div> |
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Siyuan Niu, Adrien Suau, Gabriel Staffelbach, Aida Todri-Sanial. A Hardware-Aware Heuristic for the Qubit Mapping Problem in the NISQ Era. <i>IEEE Transactions on Quantum Engineering</i>, IEEE, In press, <a target="_blank" href="https://dx.doi.org/10.1109/TQE.2020.3026544">⟨10.1109/TQE.2020.3026544⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02956191">⟨lirmm-02956191⟩</a> </div> |
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Abhishek Singh Dahiya, J Thireau, Jamila Boudaden, Swatchith Lal, Umair Gulzar, et al.. Energy Autonomous Wearable Sensors for Smart Healthcare: A Review. <i>Journal of The Electrochemical Society</i>, Electrochemical Society, 2020, JES Focus Issue on Sensor Reviews, 167 (3), <a target="_blank" href="https://dx.doi.org/10.1149/2.0162003JES">⟨10.1149/2.0162003JES⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02387984">⟨lirmm-02387984⟩</a> </div> |
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Jie Liang, Rongmei Chen, Raphaël Ramos, Jaeyoung Lee, Hanako Okuno, et al.. Investigation of Pt-Salt-Doped-Standalone-Multiwall Carbon Nanotubes for On-Chip Interconnect Applications. <i>IEEE Transactions on Electron Devices</i>, Institute of Electrical and Electronics Engineers, 2019, 66 (5), pp.2346-2352. <a target="_blank" href="https://dx.doi.org/10.1109/TED.2019.2901658">⟨10.1109/TED.2019.2901658⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02082869">⟨lirmm-02082869⟩</a> </div> |
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Massimo Alioto, Magdy S. Abadir, Tughrul Arslan, Chirn Chye Boon, Andreas Burg, et al.. Editorial TVLSI Positioning—Continuing and Accelerating an Upward Trajectory. <i>IEEE Transactions on Very Large Scale Integration (VLSI) Systems</i>, IEEE, 2019, 27 (2), pp.253-280. <a target="_blank" href="https://dx.doi.org/10.1109/TVLSI.2018.2886389">⟨10.1109/TVLSI.2018.2886389⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02171964">⟨lirmm-02171964⟩</a> </div> |
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Aida Todri-Sanial, Xueqing Li, Juan Núñez. Emerging technologies and computing paradigms for the Internet of Everything applications. <i>International Journal of Circuit Theory and Applications</i>, Wiley, 2019, <a target="_blank" href="https://dx.doi.org/10.1002/cta.2666">⟨10.1002/cta.2666⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02171974">⟨lirmm-02171974⟩</a> </div> |
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Rongmei Chen, Jie Liang, Jaehyun Lee, Vihar P. Georgiev, Raphael Ramos, et al.. Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances - Part II: Impact of Charge Transfer Doping. <i>IEEE Transactions on Electron Devices</i>, Institute of Electrical and Electronics Engineers, 2018, 65 (11), pp.4963-4970. <a target="_blank" href="https://dx.doi.org/10.1109/TED.2018.2868424">⟨10.1109/TED.2018.2868424⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01879940">⟨lirmm-01879940⟩</a> </div> |
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Jie Liang, Jaehyun Lee, Salim Berrada, Vihar Georgiev, Reetu Raj Pandey, et al.. Atomistic to Circuit-Level Modeling of Doped SWCNT for On-Chip Interconnects. <i>IEEE Transactions on Nanotechnology</i>, Institute of Electrical and Electronics Engineers, 2018, 17 (6), pp.1084-1088. <a target="_blank" href="https://dx.doi.org/10.1109/TNANO.2018.2802320">⟨10.1109/TNANO.2018.2802320⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01795792">⟨lirmm-01795792⟩</a> </div> |
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Rongmei Chen, Jie Liang, Jaehyun Lee, Vihar P. Georgiev, Raphael Ramos, et al.. Variability Study of MWCNT Local Interconnects Considering Defects and Contact Resistances - Part I: Pristine MWCNT. <i>IEEE Transactions on Electron Devices</i>, Institute of Electrical and Electronics Engineers, 2018, 65 (11), pp.4955-4962. <a target="_blank" href="https://dx.doi.org/10.1109/TED.2018.2868421">⟨10.1109/TED.2018.2868421⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01879935">⟨lirmm-01879935⟩</a> </div> |
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Liuyang Zhang, Erya Deng, Hao Cai, You Wang, Lionel Torres, et al.. A high-reliability and low-power computing-in-memory implementation within STT-MRAM. <i>Microelectronics Journal</i>, Elsevier, 2018, 81, pp.69-75. <a target="_blank" href="https://dx.doi.org/10.1016/j.mejo.2018.09.005">⟨10.1016/j.mejo.2018.09.005⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880058">⟨lirmm-01880058⟩</a> </div> |
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Liuyang Zhang, Yuanqing Cheng, Kang Wang, Lionel Torres, Youguang Zhang, et al.. Addressing the Thermal Issues of STT-MRAM From Compact Modeling to Design Techniques. <i>IEEE Transactions on Nanotechnology</i>, Institute of Electrical and Electronics Engineers, 2018, 17 (2), pp.345-352. <a target="_blank" href="https://dx.doi.org/10.1109/TNANO.2018.2803340">⟨10.1109/TNANO.2018.2803340⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880065">⟨lirmm-01880065⟩</a> </div> |
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Ying-Lin Zhao, Jianlei Yang, Weisheng Zhao, Aida Todri-Sanial, Yuanqing Cheng. Power Supply Noise Aware Task Scheduling on Homogeneous 3D MPSoCs Considering the Thermal Constraint. <i>Journal of Computer Science and Technology</i>, Springer Verlag, 2018, 33 (5), pp.966-983. <a target="_blank" href="https://dx.doi.org/10.1007/s11390-018-1868-6">⟨10.1007/s11390-018-1868-6⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01879928">⟨lirmm-01879928⟩</a> </div> |
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Jaehyun Lee, Salim Berrada, Fikru Adamu-Lema, Nicole Nagy, Vihar P. Georgiev, et al.. Understanding Electromigration in Cu-CNT Composite Interconnects: A Multiscale Electrothermal Simulation Study. <i>IEEE Transactions on Electron Devices</i>, Institute of Electrical and Electronics Engineers, 2018, 65 (9), pp.3884-3892. <a target="_blank" href="https://dx.doi.org/10.1109/TED.2018.2853550">⟨10.1109/TED.2018.2853550⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01867729">⟨lirmm-01867729⟩</a> </div> |
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Aida Todri-Sanial, Raphael Ramos, Hanako Okuno, Jean Dijon, Abitha Dhavamani, et al.. A Survey of Carbon Nanotube Interconnects for Energy Efficient Integrated Circuits. <i>IEEE Circuits and Systems Magazine -New Series-</i>, Institute of Electrical and Electronics Engineers, 2017, 17 (2), pp.47-62. <a target="_blank" href="https://dx.doi.org/10.1109/MCAS.2017.2689538">⟨10.1109/MCAS.2017.2689538⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01795757">⟨lirmm-01795757⟩</a> </div> |
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Bi Wu, Yuanqing Cheng, Jianlei Yang, Aida Todri-Sanial, Weisheng Zhao. Temperature Impact Analysis and Access Reliability Enhancement for 1T1MTJ STT-RAM. <i>IEEE Transactions on Reliability</i>, Institute of Electrical and Electronics Engineers, 2016, 65 (4), pp.1755-1768. <a target="_blank" href="https://dx.doi.org/10.1109/TR.2016.2608910">⟨10.1109/TR.2016.2608910⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446148">⟨lirmm-01446148⟩</a> </div> |
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Alessandro Magnani, Massimiliano De Magistris, Aida Todri-Sanial, Antonio Maffucci. Electrothermal Analysis of Carbon Nanotubes Power Delivery Networks for Nanoscale Integrated Circuits. <i>IEEE Transactions on Nanotechnology</i>, Institute of Electrical and Electronics Engineers, 2016, 15 (3), pp.380-388. <a target="_blank" href="https://dx.doi.org/10.1109/TNANO.2016.2535390">⟨10.1109/TNANO.2016.2535390⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01445865">⟨lirmm-01445865⟩</a> </div> |
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Yuanqing Cheng, Aida Todri-Sanial, Jianlei Yang, Weisheng Zhao. Alleviating Through-Silicon-Via Electromigration for 3-D Integrated Circuits Taking Advantage of Self-Healing Effect. <i>IEEE Transactions on Very Large Scale Integration (VLSI) Systems</i>, IEEE, 2016, 24 (11), pp.3310-3322. <a target="_blank" href="https://dx.doi.org/10.1109/TVLSI.2016.2543260">⟨10.1109/TVLSI.2016.2543260⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446125">⟨lirmm-01446125⟩</a> </div> |
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Aida Todri-Sanial, Yuanqing Cheng. A Study of 3-D Power Delivery Networks With Multiple Clock Domains. <i>IEEE Transactions on Very Large Scale Integration (VLSI) Systems</i>, IEEE, 2016, 24 (11), pp.3218-3231. <a target="_blank" href="https://dx.doi.org/10.1109/TVLSI.2016.2549275">⟨10.1109/TVLSI.2016.2549275⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446137">⟨lirmm-01446137⟩</a> </div> |
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Aida Todri-Sanial, Sanjukta Bhanja. Special Issue on Advances in Design of Ultra-Low Power Circuits and Systems in Emerging Technologies. <i>ACM Journal on Emerging Technologies in Computing Systems</i>, Association for Computing Machinery, 2015, Guest Editorial, 12 (2), pp.#11. <a target="_blank" href="https://dx.doi.org/10.1145/2756554">⟨10.1145/2756554⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01255756">⟨lirmm-01255756⟩</a> </div> |
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Aida Todri-Sanial, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo, et al.. Globally Constrained Locally Optimized 3-D Power Delivery Networks. <i>IEEE Transactions on Very Large Scale Integration (VLSI) Systems</i>, IEEE, 2014, 22 (10), pp.2131-2144. <a target="_blank" href="https://dx.doi.org/10.1109/TVLSI.2013.2283800">⟨10.1109/TVLSI.2013.2283800⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01255754">⟨lirmm-01255754⟩</a> </div> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. An SRAM Based Monitor for Mixed-Field Radiation Environments. <i>IEEE Transactions on Nuclear Science</i>, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1663-1670. <a target="_blank" href="https://dx.doi.org/10.1109/TNS.2014.2299733">⟨10.1109/TNS.2014.2299733⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234441">⟨lirmm-01234441⟩</a> </div> |
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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs. <i>IEEE Transactions on Very Large Scale Integration (VLSI) Systems</i>, IEEE, 2014, 22 (11), pp.2326-2335. <a target="_blank" href="https://dx.doi.org/10.1109/TVLSI.2013.2294080">⟨10.1109/TVLSI.2013.2294080⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248578">⟨lirmm-01248578⟩</a> </div> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Evaluating a Radiation Monitor for Mixed-Field Environments based on SRAM Technology. <i>Journal of Instrumentation</i>, IOP Publishing, 2014, 9 (5), pp.#C05052. <a target="_blank" href="https://dx.doi.org/10.1088/1748-0221/9/05/C05052">⟨10.1088/1748-0221/9/05/C05052⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234448">⟨lirmm-01234448⟩</a> </div> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Multiple Cell Upset Classification in Commercial SRAMs. <i>IEEE Transactions on Nuclear Science</i>, Institute of Electrical and Electronics Engineers, 2014, 61 (4), pp.1747-1754. <a target="_blank" href="https://dx.doi.org/10.1109/TNS.2014.2313742">⟨10.1109/TNS.2014.2313742⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01234446">⟨lirmm-01234446⟩</a> </div> |
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Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel. Uncorrelated Power Supply Noise and Ground Bounce Consideration for Test Pattern Generation. <i>IEEE Transactions on Very Large Scale Integration (VLSI) Systems</i>, IEEE, 2013, 21 (5), pp.958-970. <a target="_blank" href="https://dx.doi.org/10.1109/TVLSI.2012.2197427">⟨10.1109/TVLSI.2012.2197427⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806774">⟨lirmm-00806774⟩</a> </div> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. Testing a Commercial MRAM under Neutron and Alpha Radiation in Dynamic Mode. <i>IEEE Transactions on Nuclear Science</i>, Institute of Electrical and Electronics Engineers, 2013, 60 (4), pp.2617-2622. <a target="_blank" href="https://dx.doi.org/10.1109/TNS.2013.2239311">⟨10.1109/TNS.2013.2239311⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805005">⟨lirmm-00805005⟩</a> </div> |
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Aida Todri-Sanial, Sandip Kundu, Patrick Girard, Alberto Bosio, Luigi Dilillo, et al.. A Study of Tapered 3-D TSVs for Power and Thermal Integrity. <i>IEEE Transactions on Very Large Scale Integration (VLSI) Systems</i>, IEEE, 2013, 21 (2), pp.306-319. <a target="_blank" href="https://dx.doi.org/10.1109/TVLSI.2012.2187081">⟨10.1109/TVLSI.2012.2187081⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806776">⟨lirmm-00806776⟩</a> </div> |
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Aida Todri-Sanial, Malgorzata Marek-Sadowska. Power Delivery for Multicore Systems. <i>IEEE Transactions on Very Large Scale Integration (VLSI) Systems</i>, IEEE, 2011, 19 (12), pp.2243-2255. <a target="_blank" href="https://dx.doi.org/10.1109/TVLSI.2010.2080694">⟨10.1109/TVLSI.2010.2080694⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248575">⟨lirmm-01248575⟩</a> </div> |
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Aida Todri-Sanial, L. Perera, R. Rivera, S. Kwan. Reliability and Performance Studies of DC-DC Conversion Powering Scheme for the CMS Pixel Tracker at SLHC. <i>Journal of Instrumentation</i>, IOP Publishing, 2010, 5 (C12010), <a target="_blank" href="https://dx.doi.org/10.1088/1748-0221/5/12/C12010">⟨10.1088/1748-0221/5/12/C12010⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01255752">⟨lirmm-01255752⟩</a> </div> |
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A. Andreani, A. Andreazza, A. Annovi, M. Beretta, V. Bevacqua, et al.. Enhancement of the ATLAS trigger system with a hardware tracker finder FTK. <i>Journal of Instrumentation</i>, IOP Publishing, 2010, 5, <a target="_blank" href="https://dx.doi.org/10.1088/1748-0221/5/12/C12037">⟨10.1088/1748-0221/5/12/C12037⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01973463">⟨lirmm-01973463⟩</a> </div> |
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Aida Todri-Sanial, Malgorzata Marek-Sadowska. Reliability Analysis and Optimization of Power-Gated ICs. <i>IEEE Transactions on Very Large Scale Integration (VLSI) Systems</i>, IEEE, 2009, 19 (3), pp.457-468. <a target="_blank" href="https://dx.doi.org/10.1109/TVLSI.2009.2036267">⟨10.1109/TVLSI.2009.2036267⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880086">⟨lirmm-01880086⟩</a> </div> |
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<h3 class="doc-header">Communication dans un congrès<small class="doc-nb">122 documents</small></h3> |
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Aida Todri-Sanial. Progress and Challenges on Quantum Computer-Aided Design. <i>IBM Quantum Summit</i>, Sep 2020, Virtual, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025303">⟨lirmm-03025303⟩</a> </div> |
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Aida Todri-Sanial. Toward New Era of Computing: From Devices to Applications. <i>What’s next in Computing ?</i>, Jul 2020, Montpellier (virtual), France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025126">⟨lirmm-03025126⟩</a> </div> |
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Aida Todri-Sanial. Quantum Computing: Pushing the limits of computing. <i>IBM Think Digital Summit France</i>, Oct 2020, Virtual, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025260">⟨lirmm-03025260⟩</a> </div> |
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Madeleine Abernot, Thierry Gil, Aida Todri-Sanial. Using Oscillatory Neural Network for Pattern Recognition and Mobile Robot Control. <i>SOPHI.A SUMMIT</i>, Nov 2020, Sophia Antipolis, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03023088">⟨lirmm-03023088⟩</a> </div> |
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Aida Todri-Sanial. Neuromorphic Computing based on Oscillatory Neural Networks. <i>SOPHI.A SUMMIT</i>, Nov 2020, Sophia Antipolis, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03022129">⟨lirmm-03022129⟩</a> </div> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02549406" target="_blank"> |
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Aida Todri-Sanial. Design and Technology-level Optimization Challenges for Carbon Nanotube Circuits. <i>International Workshop on Advanced Electronic Design Automation (EDA)</i>, Jan 2020, Xidian, China. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02549406">⟨lirmm-02549406⟩</a> </div> |
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Aida Todri-Sanial. Quantum Initiative at the University of Montpellier. <i>French Tech London Quantum Webinar</i>, Jun 2020, Montpellier, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025169">⟨lirmm-03025169⟩</a> </div> |
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Aida Todri-Sanial, Stefania Carapezzi, Corentin Delacour, Madeleine Abernot, Eirini Karachristou, et al.. EU H2020 NEURONN: Two-Dimensional Oscillatory Neural Networks for Energy Efficient Neuromorphic Computing. <i>European Forum for Electronic Components and Systems (EFECS)</i>, Nov 2020, Brussels, Belgium. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03024126">⟨lirmm-03024126⟩</a> </div> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025221" target="_blank"> |
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Aida Todri-Sanial. A Look Into Physical Modeling and Design for Carbon Nanotube based Circuits. <i>10th IEEE CASS Rio Grande do Sul Workshop</i>, Nov 2020, Virtual, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025221">⟨lirmm-03025221⟩</a> </div> |
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Aida Todri-Sanial. Physical Design Challenges and Solutions for 3D Stacked and Monolithic 3D Integration. <i>ASP-DAC</i>, Jan 2020, Beijing, China. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02487849">⟨lirmm-02487849⟩</a> </div> |
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Abhishek Singh Dahiya, Thierry Gil, Nadine Azemard, J Thireau, Alain Lacampagne, et al.. Stretchable Strain Sensors for Human Movement Monitoring. <i>22nd Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP)</i>, Jun 2020, (Virtual ), France. <a target="_blank" href="https://dx.doi.org/10.1109/DTIP51112.2020.9139154">⟨10.1109/DTIP51112.2020.9139154⟩</a>. <a target="_blank" href="https://hal.archives-ouvertes.fr/hal-02903236">⟨hal-02903236⟩</a> </div> |
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Aida Todri-Sanial. Quantum Challenges: Hardware and Software Perspectives. <i>FRANCE IS AI</i>, Nov 2020, Online, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03024235">⟨lirmm-03024235⟩</a> </div> |
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Jie Liang, Aida Todri-Sanial. Importance of Interconnects: A Technology-System-Level Design Perspective. <i>65th International Electron Device Meeting (IEDM)</i>, Dec 2019, San Francisco, United States. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02388007">⟨lirmm-02388007⟩</a> </div> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02131987" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8464032/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty. Reliable Power Delivery and Analysis of Power-Supply Noise During Testing in Monolithic 3D ICs. <i>VTS: VLSI Test Symposium</i>, Apr 2019, Monterey, CA, United States. <a target="_blank" href="https://dx.doi.org/10.1109/VTS.2019.8758650">⟨10.1109/VTS.2019.8758650⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02131987">⟨lirmm-02131987⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02132005" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8464030/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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Kafil M. Razeeb, Cian O'Murchu, Aida Todri-Sanial, Frederik Sebelius, Indranil Bose, et al.. SmartVista: Smart Autonomous Multi Modal Sensors for Vital Signs Monitoring. <i>SSI: Smart System Integration</i>, Apr 2019, Barcelona, Spain. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02132005">⟨lirmm-02132005⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02387999" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8552344/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Aida Todri-Sanial. Physical design and optimisation methods for TSV-based 3D and monolithic 3D integration. <i>15th Workshop on Heterogeneous Integration of Nanomaterials and Innovative Devices</i>, Sep 2019, Krakow, Poland. pp.217-220, <a target="_blank" href="https://dx.doi.org/10.1109/TVLSI.2010.2080694.12">⟨10.1109/TVLSI.2010.2080694.12⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02387999">⟨lirmm-02387999⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880198" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8461283/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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Benjamin Uhlig, Jie Liang, Lee Jaehyun, Raphael Ramos, Abitha Dhavamani, et al.. Progress on carbon nanotube BEOL interconnects. <i>DATE: Design, Automation and Test in Europe</i>, Mar 2018, Dresden, Germany. pp.937-942, <a target="_blank" href="https://dx.doi.org/10.23919/DATE.2018.8342144">⟨10.23919/DATE.2018.8342144⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880198">⟨lirmm-01880198⟩</a> </div> |
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</li> |
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Benjamin Uhlig, Abitha Dhavamani, Nicole Nagy, Katharina Lilienthal, R. Liske, et al.. Challenges and Progress on Carbon Nanotube Integration for BEOL Interconnects. <i>IITC: International Interconnect Technology Conference</i>, Jun 2018, Santa Clara, United States. pp.16-18, <a target="_blank" href="https://dx.doi.org/10.1109/IITC.2018.8430411">⟨10.1109/IITC.2018.8430411⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880138">⟨lirmm-01880138⟩</a> </div> |
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</li> |
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<li class="media"> |
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<div class="media-body"> |
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Abhishek Koneru, Aida Todri-Sanial, Krishnendu Chakrabarty. Power-Supply Noise Analysis for Monolithic 3D ICs Using Electrical and Thermal Co-Simulation. <i>ICECS: International Conference on Electronics Circuits and Systems</i>, Dec 2018, Bordeaux, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880158">⟨lirmm-01880158⟩</a> </div> |
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</li> |
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<li class="media"> |
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Dijun Liu, Yuanqing Cheng, Y. Wang, B. Wu, B. Zhang, et al.. Chameleon: A Thermally Adaptive Error Correction Code Design for STT-MRAM LLCs. <i>DAC: Design Automation Conference</i>, Jun 2018, San Fransisco, United States. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880209">⟨lirmm-01880209⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880184" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8424047/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Liuyang Zhang, Wang Kang, Hao Cai, Peng Ouyang, Lionel Torres, et al.. A Robust Dual Reference Computing-in-Memory Implementation and Design Space Exploration Within STT-MRAM. <i>ISVLSI: International Symposium on Very Large Scale Integration</i>, Jul 2018, Hong Kong, China. pp.275-280, <a target="_blank" href="https://dx.doi.org/10.1109/ISVLSI.2018.00058">⟨10.1109/ISVLSI.2018.00058⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880184">⟨lirmm-01880184⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01800286" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8315502/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Aida Todri-Sanial, Jie Liang. Power and Performance Analysis of Doped SW/DW CNT for On-Chip Interconnect Application. <i>GRAPHENE</i>, Mar 2017, Barcelone, Spain. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01800286">⟨lirmm-01800286⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01795803" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8486213/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Jaehyun Lee, Jie Liang, Salvatore Amoroso, Toufik Sadi, Liping Wang, et al.. Atoms-to-circuits simulation investigation of CNT interconnects for next generation CMOS technology. <i>SISPAD: Simulation of Semiconductor Processes and Devices</i>, Sep 2017, Kamakura, Japan. pp.153-156, <a target="_blank" href="https://dx.doi.org/10.23919/SISPAD.2017.8085287">⟨10.23919/SISPAD.2017.8085287⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01795803">⟨lirmm-01795803⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01800290" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8315504/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Lee Jaehyun, Sadi Toufik, Jie Liang, Vihar Georgiev, Aida Todri-Sanial, et al.. A hierarchical model for CNT and Cu-CNT composite interconnects: from density functional theory to circuit-level simulations. <i>IWCN: International Workshop on Computational Nanotechnology</i>, Jun 2017, Windermere, United Kingdom. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01800290">⟨lirmm-01800290⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01795799" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8486217/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Jaehyun Lee, Salim Berrada, Jie Liang, Toufik Sadi, Vihar Georgiev, et al.. The impact of vacancy defects on CNT interconnects: From statistical atomistic study to circuit simulations. <i>SISPAD: Simulation of Semiconductor Processes and Devices</i>, Sep 2017, Kamakura, Japan. pp.157-160, <a target="_blank" href="https://dx.doi.org/10.23919/SISPAD.2017.8085288">⟨10.23919/SISPAD.2017.8085288⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01795799">⟨lirmm-01795799⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880220" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8486212/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Jie Liang, Lee Jaehyun, Salim Berrada, Vihar P. Georgiev, Asenov Asen, et al.. Atomistic to circuit level modeling of defective doped SWCNTs with contacts for on-chip interconnect application. <i>NMDC: Nanotechnology Materials and Devices Conference</i>, Oct 2017, Singapore, Singapore. pp.66-67, <a target="_blank" href="https://dx.doi.org/10.1109/NMDC.2017.8350506">⟨10.1109/NMDC.2017.8350506⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01880220">⟨lirmm-01880220⟩</a> </div> |
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</li> |
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<li class="media"> |
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<div class="media-body"> |
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Jie Liang, Raphael Ramos, Jean Dijon, H. Okuno, D. Kalita, et al.. A physics-based investigation of Pt-salt doped carbon nanotubes for local interconnects. <i>IEDM: International Electron Devices Meeting</i>, Dec 2017, San Francisco, United States. <a target="_blank" href="https://dx.doi.org/10.1109/IEDM.2017.8268502">⟨10.1109/IEDM.2017.8268502⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01795777">⟨lirmm-01795777⟩</a> </div> |
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</li> |
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<li class="media"> |
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<div class="media-body"> |
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Aida Todri-Sanial. Toward Carbon Nanotube Computing. <i>Emerging Technology</i>, May 2017, Varsovie, Poland. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01457269">⟨lirmm-01457269⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01795816" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8475865/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Alessandro Magnani, Massimiliano de Magistris, Salomeh Heidari, Aida Todri-Sanial, Antonio Maffucci. Electrical performance of carbon-based power distribution networks with thermal effects. <i>SPI: Signal and Power Integrity</i>, May 2017, Baveno, Italy. <a target="_blank" href="https://dx.doi.org/10.1109/SaPIW.2017.7944044">⟨10.1109/SaPIW.2017.7944044⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01795816">⟨lirmm-01795816⟩</a> </div> |
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</li> |
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<div class="media-body"> |
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Nicolas Jeanniot, Gaël Pillonnet, Pascal Nouet, Nadine Azemard, Aida Todri-Sanial. Synchronised 4-Phase Resonant Power Clock Supply for Energy Efficient Adiabatic Logic. <i>ICRC: International Conference on Rebooting Computing</i>, Nov 2017, Washington, DC, United States. <a target="_blank" href="https://dx.doi.org/10.1109/ICRC.2017.8123661">⟨10.1109/ICRC.2017.8123661⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01768831">⟨lirmm-01768831⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446275" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8150972/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Liuyang Zhang, Aida Todri-Sanial, Wang Kang, Youguang Zhang, Lionel Torres, et al.. Quantitative evaluation of reliability and performance for STT-MRAM. <i>ISCAS: International Symposium on Circuits and Systems</i>, May 2016, Montréal, QC, Canada. pp.1150-1153, <a target="_blank" href="https://dx.doi.org/10.1109/ISCAS.2016.7527449">⟨10.1109/ISCAS.2016.7527449⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446275">⟨lirmm-01446275⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446283" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8150973/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Alessandro Magnani, Massimiliano De Magistris, Antonio Maffucci, Aida Todri-Sanial. A clustering technique for fast electrothermal analysis of on-chip power distribution networks. <i>SPI: Signal and Power Integrity</i>, May 2016, Turin, Italy. <a target="_blank" href="https://dx.doi.org/10.1109/SaPIW.2016.7496292">⟨10.1109/SaPIW.2016.7496292⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446283">⟨lirmm-01446283⟩</a> </div> |
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</li> |
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<li class="media"> |
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<div class="media-body"> |
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Aida Todri-Sanial. Electrothermal Modeling and Analysis of Carbon Nanotube Interconnects. <i>PATMOS: Power And Timing Modeling, Optimization and Simulation</i>, Sep 2016, Brême, Germany. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01457256">⟨lirmm-01457256⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01457338" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8157640/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Jie Liang, Liuyang Zhang, Nadine Azemard, Pascal Nouet, Aida Todri-Sanial. Physical description and analysis of doped carbon nanotube interconnects. <i>PATMOS: Power And Timing Modeling, Optimization and Simulation</i>, Sep 2016, Brême, Germany. pp.250-255, <a target="_blank" href="https://dx.doi.org/10.1109/PATMOS.2016.7833695">⟨10.1109/PATMOS.2016.7833695⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01457338">⟨lirmm-01457338⟩</a> </div> |
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</li> |
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<li class="media"> |
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<div class="media-body"> |
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Aida Todri-Sanial. Modeling and Simulation of Carbon Nanotube Interconnects. <i>SISPAD: Simulation of Semiconductor Processes and Devices</i>, Sep 2016, Nuremberg, Germany. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01457260">⟨lirmm-01457260⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01457289" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8157637/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Aida Todri-Sanial. Investigation of electrical and thermal properties of carbon nanotube interconnects. <i>PATMOS: Power and Timing Modeling, Optimization and Simulation</i>, Sep 2016, Brême, Zimbabwe. pp.25-32, <a target="_blank" href="https://dx.doi.org/10.1109/PATMOS.2016.7833421">⟨10.1109/PATMOS.2016.7833421⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01457289">⟨lirmm-01457289⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446241" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8150970/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Aida Todri-Sanial, Alessandro Magnani, Massimiliano De Magistris, Antonio Maffucci. Present and future prospects of carbon nanotube interconnects for energy efficient integrated circuits. <i>EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems</i>, Apr 2016, Montpellier, France. <a target="_blank" href="https://dx.doi.org/10.1109/EuroSimE.2016.7463379">⟨10.1109/EuroSimE.2016.7463379⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446241">⟨lirmm-01446241⟩</a> </div> |
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</li> |
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<li class="media"> |
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<div class="media-body"> |
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Liuyang Zhang, Yuanqing Cheng, Wang Kang, Youguang Zhang, Lionel Torres, et al.. Reliability and performance evaluation for STT-MRAM under temperature variation. <i>EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems</i>, Apr 2016, Montpellier, France. <a target="_blank" href="https://dx.doi.org/10.1109/EuroSimE.2016.7463380">⟨10.1109/EuroSimE.2016.7463380⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446252">⟨lirmm-01446252⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal.archives-ouvertes.fr/hal-01348476" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8109771/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Nicolas Jeanniot, Aida Todri-Sanial, Pascal Nouet, Gaël Pillonnet, Hervé Fanet. Investigation of the power-clock network impact on adiabatic logic. <i>SPI: Signal and Power Integrity</i>, May 2016, Turin, Italy. <a target="_blank" href="https://dx.doi.org/10.1109/SaPIW.2016.7496270">⟨10.1109/SaPIW.2016.7496270⟩</a>. <a target="_blank" href="https://hal.archives-ouvertes.fr/hal-01348476">⟨hal-01348476⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446182" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8150965/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Ghizlane Mouslih, Aida Todri-Sanial, Pascal Nouet. On Analysis of On-chip DC-DC Converters for Power Delivery Networks. <i>ISVLSI: International Symposium on Very Large Scale Integration</i>, Jul 2015, Montpellier, France. pp.557-560, <a target="_blank" href="https://dx.doi.org/10.1109/ISVLSI.2015.96">⟨10.1109/ISVLSI.2015.96⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446182">⟨lirmm-01446182⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446233" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8150967/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Aida Todri-Sanial. Carbon nanotube interconnects for energy-efficient integrated circuits. <i>TNT: Trends in Nanotechnology</i>, Sep 2015, Toulouse, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446233">⟨lirmm-01446233⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446739" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8151388/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Alessandro Magnani, Massimiliano De Magistris, Aida Todri-Sanial, Antonio Maffucci. Carbon-based Power Delivery Networks for nanoscale ICs: electrothermal performance analysis. <i>IEEE-NANO: Nanotechnology</i>, Jul 2015, Rome, Italy. pp.416-419, <a target="_blank" href="https://dx.doi.org/10.1109/NANO.2015.7388625">⟨10.1109/NANO.2015.7388625⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01446739">⟨lirmm-01446739⟩</a> </div> |
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</li> |
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<li class="media"> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01720592" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8486210/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Lun Yang, Yuanqing Cheng, Yuhao Wang, Hao Yu, Weisheng Zhao, et al.. A body-biasing of readout circuit for STT-RAM with improved thermal reliability. <i>ISCAS: International Symposium on Circuits and Systems</i>, May 2015, Lisbon, Portugal. pp.1530-1533, <a target="_blank" href="https://dx.doi.org/10.1109/ISCAS.2015.7168937">⟨10.1109/ISCAS.2015.7168937⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01720592">⟨lirmm-01720592⟩</a> </div> |
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Charles Effiong, Vianney Lapotre, Abdoulaye Gamatié, Gilles Sassatelli, Aida Todri-Sanial, et al.. On the Performance Exploration of 3D NoCs with Resistive-Open TSVs. <i>ISVLSI: International Symposium on Very Large Scale Integration</i>, Jul 2015, Montpellier, France. pp.579-584, <a target="_blank" href="https://dx.doi.org/10.1109/ISVLSI.2015.49">⟨10.1109/ISVLSI.2015.49⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248588">⟨lirmm-01248588⟩</a> </div> |
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</li> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248586" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8423940/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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Bi Wu, Yuanqing Cheng, Ying Wang, Aida Todri-Sanial, Guangyu Sun, et al.. An architecture-level cache simulation framework supporting advanced PMA STT-MRAM. <i>NANOARCH: Nanoscale Architectures</i>, Jun 2015, Boston, MA, United States. pp.7-12, <a target="_blank" href="https://dx.doi.org/10.1109/NANOARCH.2015.7180576">⟨10.1109/NANOARCH.2015.7180576⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248586">⟨lirmm-01248586⟩</a> </div> |
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</li> |
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Alessandro Magnani, M. de Magistris, Antonio Maffucci, Aida Todri-Sanial. A node clustering reduction scheme for power grids electrothermal analysis. <i>SPI: Signal and Power Integrity</i>, May 2015, Berlin, Germany. <a target="_blank" href="https://dx.doi.org/10.1109/SaPIW.2015.7237399">⟨10.1109/SaPIW.2015.7237399⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248589">⟨lirmm-01248589⟩</a> </div> |
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</li> |
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Rida Kheirallah, Jean-Marc Galliere, Aida Todri-Sanial, Gilles R. Ducharme, Nadine Azemard. Statistical Energy Study for 28nm FDSOI Devices. <i>EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems</i>, Apr 2015, Budapest, Hungary. <a target="_blank" href="https://dx.doi.org/10.1109/EuroSimE.2015.7103149">⟨10.1109/EuroSimE.2015.7103149⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01168602">⟨lirmm-01168602⟩</a> </div> |
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</li> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248593" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8486526/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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Xiaolong Zhang, Yuanqing Cheng, Weisheng Zhao, Youguang Zhang, Aida Todri-Sanial. Exploring potentials of perpendicular magnetic anisotropy STT-MRAM for cache design. <i>ICSICT: International Conference on Solid-State and Integrated Circuit Technology</i>, Oct 2014, Guilin, China. <a target="_blank" href="https://dx.doi.org/10.1109/ICSICT.2014.7021342">⟨10.1109/ICSICT.2014.7021342⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248593">⟨lirmm-01248593⟩</a> </div> |
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</li> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Real-Time Testing of 90nm COTS SRAMs at Concordia Station in Antarctica. <i>NSREC: Nuclear and Space Radiation Effects Conference</i>, Jul 2014, Paris, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01237709">⟨lirmm-01237709⟩</a> </div> |
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Imran Wali, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Protecting combinational logic in pipelined microprocessor cores against transient and permanent faults. <i>DDECS: Design and Diagnostics of Electronic Circuits and Systems</i>, Apr 2014, Warsaw, Poland. pp.223-225, <a target="_blank" href="https://dx.doi.org/10.1109/DDECS.2014.6868794">⟨10.1109/DDECS.2014.6868794⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248598">⟨lirmm-01248598⟩</a> </div> |
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</li> |
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Anu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Path delay test in the presence of multi-aggressor crosstalk, power supply noise and ground bounce. <i>DDECS: Design and Diagnostics of Electronic Circuits and Systems</i>, Apr 2014, Warsaw, Poland. pp.207-212, <a target="_blank" href="https://dx.doi.org/10.1109/DDECS.2014.6868791">⟨10.1109/DDECS.2014.6868791⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248599">⟨lirmm-01248599⟩</a> </div> |
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</li> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248594" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8486525/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Carolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. TSV aware timing analysis and diagnosis in paths with multiple TSVs. <i>VTS: VLSI Test Symposium</i>, Apr 2014, Napa, CA, United States. <a target="_blank" href="https://dx.doi.org/10.1109/VTS.2014.6818772">⟨10.1109/VTS.2014.6818772⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248594">⟨lirmm-01248594⟩</a> </div> |
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</li> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248592" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8486527/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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Anu Asokan, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A Delay Probability Metric for Input Pattern Ranking Under Process Variation and Supply Noise. <i>ISVLSI: International Symposium on Very Large Scale Integration</i>, Jul 2014, Tampa, FL, United States. pp.226-231, <a target="_blank" href="https://dx.doi.org/10.1109/ISVLSI.2014.42">⟨10.1109/ISVLSI.2014.42⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248592">⟨lirmm-01248592⟩</a> </div> |
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</li> |
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Georgios Tsiligiannis, Luigi Dilillo, Viyas Gupta, Alberto Bosio, Patrick Girard, et al.. Efficient Dynamic Test Methods for COTS SRAMs Under Heavy Ion Irradiation. <i>NSREC: Nuclear and Space Radiation Effects Conference</i>, Jul 2014, Paris, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01237660">⟨lirmm-01237660⟩</a> </div> |
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Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel, et al.. Test and diagnosis of power switches. <i>DDECS: Design and Diagnostics of Electronic Circuits and Systems</i>, Apr 2014, Warsaw, Poland. pp.213-218, <a target="_blank" href="https://dx.doi.org/10.1109/DDECS.2014.6868792">⟨10.1109/DDECS.2014.6868792⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248590">⟨lirmm-01248590⟩</a> </div> |
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Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Power supply noise-aware workload assignments for homogeneous 3D MPSoCs with thermal consideration. <i>ASP-DAC: Asia and South Pacific Design Automation Conference</i>, Jan 2014, Singapore, Singapore. pp.544-549, <a target="_blank" href="https://dx.doi.org/10.1109/ASPDAC.2014.6742948">⟨10.1109/ASPDAC.2014.6742948⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248596">⟨lirmm-01248596⟩</a> </div> |
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Aymen Touati, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. A Comprehensive Evaluation of Functional Programs for Power-Aware Test. <i>NATW: North Atlantic Test Workshop</i>, May 2014, Johnson City, NY, United States. pp.69-72, <a target="_blank" href="https://dx.doi.org/10.1109/NATW.2014.23">⟨10.1109/NATW.2014.23⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248597">⟨lirmm-01248597⟩</a> </div> |
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</li> |
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Carolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Timing-aware ATPG for critical paths with multiple TSVs. <i>DDECS: Design and Diagnostics of Electronic Circuits and Systems</i>, Apr 2014, Warsaw, Poland. pp.116-121, <a target="_blank" href="https://dx.doi.org/10.1109/DDECS.2014.6868774">⟨10.1109/DDECS.2014.6868774⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248600">⟨lirmm-01248600⟩</a> </div> |
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</li> |
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Miroslav Valka, Alberto Bosio, Luigi Dilillo, Aida Todri-Sanial, Arnaud Virazel, et al.. iBoX — Jitter based Power Supply Noise sensor. <i>ETS: European Test Symposium</i>, May 2014, Paderborn, United States. <a target="_blank" href="https://dx.doi.org/10.1109/ETS.2014.6847830">⟨10.1109/ETS.2014.6847830⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248601">⟨lirmm-01248601⟩</a> </div> |
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</li> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248591" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8500288/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Stefano Bernabovi, et al.. An intra-cell defect grading tool. <i>DDECS: Design and Diagnostics of Electronic Circuits and Systems</i>, Apr 2014, Warsaw, Poland. pp.298-301, <a target="_blank" href="https://dx.doi.org/10.1109/DDECS.2014.6868814">⟨10.1109/DDECS.2014.6868814⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248591">⟨lirmm-01248591⟩</a> </div> |
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</li> |
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<li class="media"> |
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<div class="media-body"> |
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Aida Todri-Sanial. Electro-thermal characterization of Through-Silicon Vias. <i>EuroSimE</i>, Apr 2014, Ghent, Belgium. <a target="_blank" href="https://dx.doi.org/10.1109/EuroSimE.2014.6813859">⟨10.1109/EuroSimE.2014.6813859⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01973585">⟨lirmm-01973585⟩</a> </div> |
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</li> |
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<div class="media-body"> |
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Aida Todri-Sanial. Investigation of horizontally aligned carbon nanotubes for efficient power delivery in 3D ICs. <i>SPI: Signal and Power Integrity</i>, May 2014, Ghent, Belgium. <a target="_blank" href="https://dx.doi.org/10.1109/SaPIW.2014.6844535">⟨10.1109/SaPIW.2014.6844535⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01973590">⟨lirmm-01973590⟩</a> </div> |
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Anelise Kologeski, Fernanda Lima Kastensmidt, Vianney Lapotre, Abdoulaye Gamatié, Gilles Sassatelli, et al.. Performance exploration of partially connected 3D NoCs under manufacturing variability. <i>NEWCAS: New Circuits and Systems</i>, Jun 2014, Trois-Rivieres, QC, Canada. pp.61-64, <a target="_blank" href="https://dx.doi.org/10.1109/NEWCAS.2014.6933985">⟨10.1109/NEWCAS.2014.6933985⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248595">⟨lirmm-01248595⟩</a> </div> |
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</li> |
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Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Mitigate TSV Electromigration for 3D ICs - From the Architecture Perspective. <i>International Symposium on VLSI</i>, Natale, Brazil. pp.6. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00839052">⟨lirmm-00839052⟩</a> </div> |
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</li> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. SEU Monitoring in Mixed-Field Radiation Environments of Particle Accelerators. <i>RADECS: Radiation and Its Effects on Components and Systems</i>, Sep 2013, Oxford, United Kingdom. pp.1-4, <a target="_blank" href="https://dx.doi.org/10.1109/RADECS.2013.6937419">⟨10.1109/RADECS.2013.6937419⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00839085">⟨lirmm-00839085⟩</a> </div> |
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</li> |
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<div class="media-body"> |
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Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel. Fast and Accurate Electro-Thermal Analysis of Three-Dimensional Power Delivery Networks. <i>EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems</i>, Apr 2013, Wroclaw, Poland. pp.1-4, <a target="_blank" href="https://dx.doi.org/10.1109/EuroSimE.2013.6529956">⟨10.1109/EuroSimE.2013.6529956⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00839043">⟨lirmm-00839043⟩</a> </div> |
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</li> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Temperature Impact on the Neutron SER of a Commercial 90nm SRAM. <i>NSREC: Nuclear and Space Radiation Effects Conference</i>, Jul 2013, San Francisco, Ca, United States. pp.1-4. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805291">⟨lirmm-00805291⟩</a> </div> |
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</li> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Characterization of an SRAM Based Particle Detector For Mixed-Field Radiation Environments. <i>IWASI: International Workshop on Advances in Sensors and Interfaces</i>, Jun 2013, Bari, Italy. pp.75-80, <a target="_blank" href="https://dx.doi.org/10.1109/IWASI.2013.6576070">⟨10.1109/IWASI.2013.6576070⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00839046">⟨lirmm-00839046⟩</a> </div> |
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</li> |
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Carolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Computing Detection Probability of Delay Defects in Signal Line TSVs. <i>ETS: European Test Symposium</i>, May 2013, Avignon, France. <a target="_blank" href="https://dx.doi.org/10.1109/ETS.2013.6569349">⟨10.1109/ETS.2013.6569349⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00839044">⟨lirmm-00839044⟩</a> </div> |
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</li> |
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Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Worst-Case Power Supply Noise and Temperature Distribution Analysis for 3D PDNs with Multiple Clock Domains. <i>NEWCAS: New Circuits and Systems</i>, Jun 2013, Paris, France. <a target="_blank" href="https://dx.doi.org/10.1109/NEWCAS.2013.6573628">⟨10.1109/NEWCAS.2013.6573628⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00839042">⟨lirmm-00839042⟩</a> </div> |
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</li> |
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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Improving Defect Localization Accuracy by means of Effect-Cause Intra-Cell Diagnosis at Transistor Level. <i>SDD: Silicon Debug and Diagnosis</i>, Sep 2013, Anaheim, CA, United States. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806872">⟨lirmm-00806872⟩</a> </div> |
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</li> |
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Leonardo B. Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. A Built-in Scheme for Testing and Repairing Voltage Regulators of Low-Power SRAMs. <i>VTS: VLSI Test Symposium</i>, Apr 2013, Berkeley, CA, United States. pp.1-6, <a target="_blank" href="https://dx.doi.org/10.1109/VTS.2013.6548894">⟨10.1109/VTS.2013.6548894⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805366">⟨lirmm-00805366⟩</a> </div> |
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</li> |
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Leonardo B. Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. On the Reuse of Read and Write Assist Circuits to Improve Test Efficiency in Low-Power SRAMs. <i>ITC: International Test conference</i>, Sep 2013, Anaheim, CA, United States. pp.1-10, <a target="_blank" href="https://dx.doi.org/10.1109/TEST.2013.6651927">⟨10.1109/TEST.2013.6651927⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00818977">⟨lirmm-00818977⟩</a> </div> |
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</li> |
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<div class="media-body"> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Evaluating An SEU Monitor For Mixed-Field Radiation Environments. <i>iWoRID: International Workshop on Radiation Imaging Detectors</i>, SOLEIL Synchrotron, Jun 2013, Paris, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01238433">⟨lirmm-01238433⟩</a> </div> |
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</li> |
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<li class="media"> |
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Yuanqing Cheng, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A novel method to mitigate TSV electromigration for 3D ICs. <i>ISVLSI: IEEE Computer Society Annual Symposium on VLSI</i>, Aug 2013, Natal, Brazil. pp.121-126, <a target="_blank" href="https://dx.doi.org/10.1109/ISVLSI.2013.6654633">⟨10.1109/ISVLSI.2013.6654633⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248617">⟨lirmm-01248617⟩</a> </div> |
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</li> |
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Leonardo B. Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Test Solution for Data Retention Faults in Low-Power SRAMs. <i>DATE: Design, Automation and Test in Europe</i>, Mar 2013, Grenoble, France. pp.442-447, <a target="_blank" href="https://dx.doi.org/10.7873/DATE.2013.099">⟨10.7873/DATE.2013.099⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805140">⟨lirmm-00805140⟩</a> </div> |
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</li> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01433308" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8147929/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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<div class="media-body"> |
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João Azevedo, Arnaud Virazel, Yuanqing Cheng, Alberto Bosio, Luigi Dilillo, et al.. Performance Characterization of TAS-MRAM Architectures in Presence of Capacitive Defects. <i>VALID: Advances in System Testing and Validation Lifecycle</i>, Oct 2013, Venice, Italy. pp.39-44. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01433308">⟨lirmm-01433308⟩</a> </div> |
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</li> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00839062" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8103675/thumb" class="img-thumbnail thumbnail" /> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Multiple-Cell-Upsets on a commercial 90nm SRAM in Dynamic Mode. <i>RADECS: Radiation and Its Effects on Components and Systems</i>, Sep 2013, Oxford, United Kingdom. pp.1-4, <a target="_blank" href="https://dx.doi.org/10.1109/RADECS.2013.6937429">⟨10.1109/RADECS.2013.6937429⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00839062">⟨lirmm-00839062⟩</a> </div> |
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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Effect-Cause Intra-Cell Diagnosis at Transistor Level. <i>ISQED: International Symposium on Quality Electronic Design</i>, Mar 2013, Santa Clara, CA, United States. pp.460-467, <a target="_blank" href="https://dx.doi.org/10.1109/ISQED.2013.6523652">⟨10.1109/ISQED.2013.6523652⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00817224">⟨lirmm-00817224⟩</a> </div> |
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</li> |
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Aida Todri-Sanial. Frequency domain power and thermal integrity analysis of 3D power delivery networks. <i>SPI: Signal and Power Integrity</i>, May 2013, Paris, France. <a target="_blank" href="https://dx.doi.org/10.1109/SaPIW.2013.6558328">⟨10.1109/SaPIW.2013.6558328⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01973645">⟨lirmm-01973645⟩</a> </div> |
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Ioana Vatajelu, Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, et al.. On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell. <i>DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems</i>, Oct 2013, New York, United States. pp.143-148, <a target="_blank" href="https://dx.doi.org/10.1109/DFT.2013.6653597">⟨10.1109/DFT.2013.6653597⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01238413">⟨lirmm-01238413⟩</a> </div> |
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Georgios Tsiligiannis, Ioana Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, et al.. SRAM Soft Error Rate Evaluation Under Atmospheric Neutron Radiation and PVT variations. <i>IOLTS: International On-Line Testing Symposium</i>, Jul 2013, Chania, Crete, Greece. pp.145-150, <a target="_blank" href="https://dx.doi.org/10.1109/IOLTS.2013.6604066">⟨10.1109/IOLTS.2013.6604066⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00818955">⟨lirmm-00818955⟩</a> </div> |
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Elena Ioana Vatajelu, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, et al.. Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing. <i>ATS: Asian Test Symposium</i>, Nov 2013, Jiaosi Township, Taiwan. pp.109-114, <a target="_blank" href="https://dx.doi.org/10.1109/ATS.2013.30">⟨10.1109/ATS.2013.30⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248609">⟨lirmm-01248609⟩</a> </div> |
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Elena Ioana Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures. <i>DTIS: Design and Technology of Integrated Systems in Nanoscale Era</i>, Mar 2013, Abu Dhabi, United Arab Emirates. pp.39-44, <a target="_blank" href="https://dx.doi.org/10.1109/DTIS.2013.6527775">⟨10.1109/DTIS.2013.6527775⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248603">⟨lirmm-01248603⟩</a> </div> |
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</li> |
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Elena Ioana Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Analyzing resistive-open defects in SRAM core-cell under the effect of process variability. <i>ETS: European Test Symposium</i>, May 2013, Avignon, France. <a target="_blank" href="https://dx.doi.org/10.1109/ETS.2013.6569373">⟨10.1109/ETS.2013.6569373⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01921630">⟨lirmm-01921630⟩</a> </div> |
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</li> |
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Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Power Supply Noise Sensor Based on Timing Uncertainty Measurements. <i>ATS: Asian Test Symposium</i>, Nov 2012, Niigata, Japan. pp.161-166, <a target="_blank" href="https://dx.doi.org/10.1109/ATS.2012.46">⟨10.1109/ATS.2012.46⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806890">⟨lirmm-00806890⟩</a> </div> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. Evaluation of Test Algorithms Stress Effect on SRAMs under Neutron Radiation. <i>IOLTS: International On-Line Testing Symposium</i>, Jun 2012, Sitges, Spain. pp.212-222, <a target="_blank" href="https://dx.doi.org/10.1109/IOLTS.2012.6313853">⟨10.1109/IOLTS.2012.6313853⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805373">⟨lirmm-00805373⟩</a> </div> |
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</li> |
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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Resistive-Open Defects Affecting Bit-Line Selection in TAS-MRAM Architectures. <i>JNRDM: Journées Nationales du Réseau Doctoral en Microélectronique</i>, 2012, Paris, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806827">⟨lirmm-00806827⟩</a> </div> |
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</li> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806836" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8122867/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel. Electro-Thermal Analysis of 3D Power Delivery Networks. <i>DAC: Design Automation Conference</i>, 2012, San Francisco, United States. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806836">⟨lirmm-00806836⟩</a> </div> |
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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Impacts of Resistive-Open Defects in the Word-Line Selection of TAS-MRAMs. <i>Colloque GDR SoC-SiP</i>, 2012, Paris, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806842">⟨lirmm-00806842⟩</a> </div> |
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</li> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806809" target="_blank"> |
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<img alt='' src="//thumb.ccsd.cnrs.fr/8147608/thumb" class="img-thumbnail thumbnail" /> |
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</a> |
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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Impact of Resistive-Bridge Defects in TAS-MRAM Architectures. <i>ATS: Asian Test Symposium</i>, Nov 2012, Niigata, Japan. pp.125-130, <a target="_blank" href="https://dx.doi.org/10.1109/ATS.2012.37">⟨10.1109/ATS.2012.37⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806809">⟨lirmm-00806809⟩</a> </div> |
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</li> |
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Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel. Why and How Controlling Power Consumption During Test: A Survey. <i>ATS: Asian Test Symposium</i>, Nov 2012, Niigata, Japan. pp. 221-226, <a target="_blank" href="https://dx.doi.org/10.1109/ATS.2012.30">⟨10.1109/ATS.2012.30⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00818984">⟨lirmm-00818984⟩</a> </div> |
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</li> |
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Carolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Through-Silicon-Via Resistive-Open Defect Analysis. <i>ETS: European Test Symposium</i>, May 2012, Annecy, France. <a target="_blank" href="https://dx.doi.org/10.1109/ETS.2012.6233037">⟨10.1109/ETS.2012.6233037⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806848">⟨lirmm-00806848⟩</a> </div> |
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</li> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Radiation Induced Effects on Electronic Systems and ICs. <i>SETS: South European Test Seminar</i>, Mar 2012, Sauze d'Oulx, Italy. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00807055">⟨lirmm-00807055⟩</a> </div> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. Complete Framework for the Estimation of the SRAM Core-Cell Resilience to Radiation. <i>RADECS: Radiation and its Effects on Components and Systems</i>, Sep 2012, Biarritz, France. <a target="_blank" href="https://hal.archives-ouvertes.fr/hal-01935785">⟨hal-01935785⟩</a> </div> |
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Ahn Duc Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. A Pseudo-Dynamic Comparator for Error Detection in Fault Tolerant Architectures. <i>VTS: VLSI Test Symposium</i>, Apr 2012, Hawaii, United States. pp.50-55, <a target="_blank" href="https://dx.doi.org/10.1109/VTS.2012.6231079">⟨10.1109/VTS.2012.6231079⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806778">⟨lirmm-00806778⟩</a> </div> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. A Novel Framework for Evaluating the SRAM Core-Cell Sensitivity to Neutrons. <i>RADECS: European Conference on Radiation and Its Effects on Components and Systems</i>, Sep 2012, Biarritz, France. pp.1-4. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805163">⟨lirmm-00805163⟩</a> </div> |
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Leonardo B. Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Defect Analysis in Power Mode Control Logic of Low-Power SRAMs. <i>ETS: European Test Symposium</i>, May 2012, Annecy, France. <a target="_blank" href="https://dx.doi.org/10.1109/ETS.2012.6233033">⟨10.1109/ETS.2012.6233033⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805374">⟨lirmm-00805374⟩</a> </div> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. Dynamic Mode Test of a Commercial 4Mb Toggle MRAM under Neutron Radiation. <i>RADECS: European Conference on Radiation and Its Effects on Components and Systems</i>, Sep 2012, Biarritz, France. pp.1-4. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805165">⟨lirmm-00805165⟩</a> </div> |
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</li> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. Dynamic Mode Testing of SRAMS under Neutron Radiation. <i>Sixième colloque du GDR SOC-SIP du CNRS</i>, Jun 2012, Paris, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00807053">⟨lirmm-00807053⟩</a> </div> |
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</li> |
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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Fault Localization Improvement through an Intra-Cell Diagnosis Approach. <i>38th International Symposium for Testing and Failure Analysis</i>, Nov 2012, United States. pp.509-519. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806863">⟨lirmm-00806863⟩</a> </div> |
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Leonardo B. Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Low-power SRAMs Power Mode Control Logic: Failure Analysis and Test Solutions. <i>ITC'2012: International Test Conference</i>, Nov 2012, Anaheim, CA, United States. pp.1-10, <a target="_blank" href="https://dx.doi.org/10.1109/TEST.2012.6401578">⟨10.1109/TEST.2012.6401578⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805143">⟨lirmm-00805143⟩</a> </div> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri-Sanial, et al.. SRAM testing under Neutron Radiation for the evaluation of different algorithms stress. <i>15ème Journées Nationales du Réseau Doctoral en Microélectronique</i>, Jun 2012, Marseille, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00807054">⟨lirmm-00807054⟩</a> </div> |
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</li> |
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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Impact of Resistive-Open Defects on the Heat Current of TAS-MRAM Architectures. <i>DATE: Design, Automation and Test in Europe</i>, Mar 2012, Dresden, Germany. pp.532-537, <a target="_blank" href="https://dx.doi.org/10.1109/DATE.2012.6176526">⟨10.1109/DATE.2012.6176526⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00689024">⟨lirmm-00689024⟩</a> </div> |
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</li> |
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Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Adaptive Voltage Scaling via Effective On-Chip Timing Uncertainty Measurements. <i>Colloque GDR SoC-SiP</i>, 2012, Paris, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806859">⟨lirmm-00806859⟩</a> </div> |
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</li> |
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<li class="media"> |
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<div class="media-body"> |
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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis. <i>Colloque GDR SoC-SiP</i>, 2012, Paris, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806841">⟨lirmm-00806841⟩</a> </div> |
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</li> |
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<div class="media-body"> |
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Carolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Resistive-Open Defect Analysis for Through-Silicon-Vias. <i>DCIS: Design of Circuits and Integrated Systems</i>, 2012, Avignon, France. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806803">⟨lirmm-00806803⟩</a> </div> |
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</li> |
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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Analysis of Resistive-Open Defects in TAS-MRAM Array. <i>ITC: International Test Conference</i>, Sep 2011, Anaheim, CA, United States. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00679524">⟨lirmm-00679524⟩</a> </div> |
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</li> |
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Leonardo B. Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Failure Analysis and Test Solutions for Low-Power SRAMs. <i>ATS: Asian Test Symposium</i>, Nov 2011, New Delhi, India. pp.459-460, <a target="_blank" href="https://dx.doi.org/10.1109/ATS.2011.97">⟨10.1109/ATS.2011.97⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00805123">⟨lirmm-00805123⟩</a> </div> |
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</li> |
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Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. A Study of Path Delay Variations in the Presence of Uncorrelated Power and Ground Supply Noise. <i>DDECS: Design and Diagnostics of Electronic Circuits and Systems</i>, Apr 2011, Cottbus, Germany. pp.189-194, <a target="_blank" href="https://dx.doi.org/10.1109/DDECS.2011.5783078">⟨10.1109/DDECS.2011.5783078⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00592000">⟨lirmm-00592000⟩</a> </div> |
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Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Simultaneous Power and Thermal Integrity Analysis for 3D Integrated Systems. <i>LPonTR'11: IEEE International Workshop on the Impact of Low Power on Test and Reliability</i>, Trondheim, Norway. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00651802">⟨lirmm-00651802⟩</a> </div> |
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Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, et al.. Power Supply Noise and Ground Bounce Aware Pattern Generation for Delay Testing. <i>NEWCAS: International New Circuits and Systems Conference</i>, Jun 2011, Bordeaux, France. pp.73-76, <a target="_blank" href="https://dx.doi.org/10.1109/NEWCAS.2011.5981222">⟨10.1109/NEWCAS.2011.5981222⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00647815">⟨lirmm-00647815⟩</a> </div> |
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Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, Arnaud Virazel, et al.. Power-Aware Test Pattern Generation for At-Speed LOS Testing. <i>ATS: Asian Test Symposium</i>, Nov 2011, New Delhi, India. pp.506-510. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00651917">⟨lirmm-00651917⟩</a> </div> |
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Aida Todri-Sanial, Ryan Rivera, Simon Kwan, Lalith Perera. Performance studies of CMS Pixel Tracker using DC-DC conversion powering scheme. <i>IEEE Nuclear Science Symposuim & Medical Imaging Conference</i>, 2010, Knoxville, TN, United States. <a target="_blank" href="https://dx.doi.org/10.1109/NSSMIC.2010.5873924">⟨10.1109/NSSMIC.2010.5873924⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01973723">⟨lirmm-01973723⟩</a> </div> |
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T. Liu, A. Mccarn, C. Melachrinos, C. Meroni, A. Negri, et al.. The Fast Track real time processor and its impact on muon isolation, tau and b-jet online selections at ATLAS. <i>Real Time Conference (RT), 2010 17th IEEE-NPSS</i>, 2010, Unknown, Unknown Region. pp.1-8, <a target="_blank" href="https://dx.doi.org/10.1109/RTC.2010.5750337">⟨10.1109/RTC.2010.5750337⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248627">⟨lirmm-01248627⟩</a> </div> |
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Aida Todri-Sanial, Malgorzata Marek-Sadowska. Electromigration study of power-gated grids. <i>ISLPED: International Symposium on Low Power Electronics and Design</i>, Aug 2009, San Francisco, United States. pp.315-318, <a target="_blank" href="https://dx.doi.org/10.1145/1594233.1594311">⟨10.1145/1594233.1594311⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01973747">⟨lirmm-01973747⟩</a> </div> |
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Aida Todri-Sanial, Marcos Turqueti, Ryan Rivera, Simon Kwan. Power distribution studies for CMS forward tracker. <i>IEEE Nuclear Science Symposium Conference Record (NSS/MIC)</i>, 2009, Orlando, United States. <a target="_blank" href="https://dx.doi.org/10.1109/NSSMIC.2009.5402390">⟨10.1109/NSSMIC.2009.5402390⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01973782">⟨lirmm-01973782⟩</a> </div> |
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Aida Todri-Sanial, Malgorzata Marek-Sadowska, François Maire, Christophe Matheron. A study of decoupling capacitor effectiveness in power and ground grid networks. <i>ISQED: International Symposium on Quality Electronic Design</i>, Mar 2009, San Jose, CA, United States. pp.653-658, <a target="_blank" href="https://dx.doi.org/10.1109/ISQED.2009.4810371">⟨10.1109/ISQED.2009.4810371⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01248628">⟨lirmm-01248628⟩</a> </div> |
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Aida Todri-Sanial, Malgorzata Marek-Sadowksa. A study of reliability issues in clock distribution networks. <i>IEEE International Conference on Computer Design</i>, 2008, Lake Tahoe, CA, United States. <a target="_blank" href="https://dx.doi.org/10.1109/ICCD.2008.4751847">⟨10.1109/ICCD.2008.4751847⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01973807">⟨lirmm-01973807⟩</a> </div> |
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Aida Todri-Sanial, Malgorzata Marek-Sadowska, Joseph Kozhaya. Power supply noise aware workload assignment for multi-core systems. <i>ICCAD: International Conference on Computer-Aided Design</i>, 2008, San Jose, CA, United States. <a target="_blank" href="https://dx.doi.org/10.1109/ICCAD.2008.4681594">⟨10.1109/ICCAD.2008.4681594⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01973860">⟨lirmm-01973860⟩</a> </div> |
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Aida Todri-Sanial, Malgorzata Marek-Sadowska, Shih-Chieh Chang. Analysis and optimization of power-gated ICs with multiple power gating configurations. <i>ICCAD: International Conference on Computer-Aided Design</i>, 2007, San Jose, CA, United States. <a target="_blank" href="https://dx.doi.org/10.1109/ICCAD.2007.4397361">⟨10.1109/ICCAD.2007.4397361⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01973830">⟨lirmm-01973830⟩</a> </div> |
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Aida Todri-Sanial, Shih-Chieh Chang, Malgorzata Marek-Sadowska. Electromigration and voltage drop aware power grid optimization for power gated ICs. <i>ISLPED: International Symposium on Low Power Electronics and Design</i>, 2007, Portland, OR, United States. <a target="_blank" href="https://dx.doi.org/10.1145/1283780.1283866">⟨10.1145/1283780.1283866⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01973890">⟨lirmm-01973890⟩</a> </div> |
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<h3 class="doc-header">Poster<small class="doc-nb">16 documents</small></h3> |
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Stefania Carapezzi, Madeleine Abernot, Corentin Delacour, Nadine Azemard, Jeremie Salles, et al.. NeurONN: Neuromorphic Computing for Artificial Intelligence at the Edge. <i>3rd AI Compute Symposium (IBM IEEE CAS/EDS)</i>, Oct 2020, Zurich (virtual), Switzerland. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03009213">⟨lirmm-03009213⟩</a> </div> |
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Marwa Dhifallah, Jie Liang, Thierry Gil, Nadine Azemard, Benoît Charlot, et al.. Piezoelectric Sensors Based on 1D/2D Materials for Smart Health Monitorin IoT. <i>Colloque du GDR SoC-SiP</i>, Jun 2019, Montpellier, France. 13ème Colloque National du GDR SOC2, 2019. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02132507">⟨lirmm-02132507⟩</a> </div> |
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Abhishek Singh Dahiya, Benoît Charlot, Marwa Dhifallah, Thierry Gil, Nadine Azemard, et al.. SmartVista: Smart Autonomous Multi Modal Sensors for Vital Signs Monitoring. <i>Workshop on ‘Smart Bioelectronic and Wearable Systems’</i>, Oct 2019, Brussels, Belgium. 2019. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02387949">⟨lirmm-02387949⟩</a> </div> |
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Gaël Pillonnet, Philippe Basset, Aida Todri-Sanial. Ultimate Power Dissipation for Computing based on Energy-Reversible and Capacitive Electromechanical Devices. <i>Colloque du GDR SoC-SiP</i>, Jun 2019, Montpellier, France. 13ème Colloque National du GDR SOC2, 2019. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02132536">⟨lirmm-02132536⟩</a> </div> |
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Jie Liang, Raphael Ramos, Jean Dijon, Hanako Okuno, Dipankar Kalita, et al.. Progress on Pt-Salt Doped Carbon Nanotubes for Local Interconnects. <i>Colloque du GDR SoC-SiP</i>, Jun 2018, Paris, France. 12ème Colloque National du GDR SoC-SiP, 2018. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02132496">⟨lirmm-02132496⟩</a> </div> |
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Nicolas Jeanniot, Gaël Pillonnet, Aida Todri-Sanial. 4-Phase Resonant Power-Clock Supply for Adiabatic Logic. <i>Colloque du GDR SoC-SiP</i>, Jun 2017, Bordeaux, France. 11ème Colloque National du GDR SoC-SiP, 2017. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01800297">⟨lirmm-01800297⟩</a> </div> |
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Nicolas Jeanniot, Aida Todri-Sanial, Pascal Nouet, Gaël Pillonnet, Hervé Fanet. Impact of Power-Clock Network on Adiabatic Logic. <i>Colloque du GDR SoC-SiP</i>, Jun 2016, Nantes, France. 10ème Colloque National du GDR SoC-SiP, 2016. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01456996">⟨lirmm-01456996⟩</a> </div> |
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Liuyang Zhang, Yuanquing Cheng, Wang Kang, Yaojun Zhang, Weisheng Zhao, et al.. Investigation of Reliability and Performance for STT-MRAM under PVT Variations. <i>Colloque du GDR SoC-SiP</i>, Jun 2016, Nantes, France. 10ème Colloque National du GDR SoC-SiP, 2016. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01457244">⟨lirmm-01457244⟩</a> </div> |
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Carolina Momo Metzler, Aida Todri-Sanial, Patrick Girard. Small Delay Defect Investigation in Critical Path Delay with Multiple TSVs. <i>EMicro-NE</i>, Oct 2015, Campina Grande, Brazil. X Escola de Microeletrônica do Nordeste, 2015. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01456983">⟨lirmm-01456983⟩</a> </div> |
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Aida Todri-Sanial. On Carbon Nanotubes as VLSI Interconnects. <i>CMOS Emerging Technology Research Symposium</i>, Jul 2014, Grenoble, France. 2014. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01456947">⟨lirmm-01456947⟩</a> </div> |
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Aida Todri-Sanial. Carbon Nanotubes for Energy Efficient Integrated Circuits. <i>CNRS Colloque Physique Theorique et ses Interfaces</i>, Nov 2014, Paris, France. 2014. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-01456951">⟨lirmm-01456951⟩</a> </div> |
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Georgios Tsiligiannis, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, et al.. Investigating Multiple-Cell-Upsets on a 90mn SRAM. <i>Colloque GDR SoC-SiP</i>, 2013, Lyon, France. 2013. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00839108">⟨lirmm-00839108⟩</a> </div> |
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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Performance Evaluation of Capacitive defects on TAS-MRAMs. <i>Colloque GDR SoC-SiP</i>, 2013, Lyon, France. 2013. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00839093">⟨lirmm-00839093⟩</a> </div> |
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Zhenzhou Sun, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, et al.. Fault-Effect Propagation Based Intra-cell Scan Chain Diagnosis. <i>Colloque GDR SoC-SiP</i>, Jun 2013, Lyon, France. 2013. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00839113">⟨lirmm-00839113⟩</a> </div> |
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Carolina Momo Metzler, Aida Todri-Sanial, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, et al.. Resistive Open Defect Analysis for Through-Silicon-Vias. <i>ETS: European Test Symposium</i>, May 2012, Annecy, France. 17th IEEE European Test Symposium, pp.183, 2012. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806795">⟨lirmm-00806795⟩</a> </div> |
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João Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, et al.. Coupling-Based Resistive-Open Defects in TAS-MRAM Architectures. <i>ETS: European Test Symposium</i>, May 2012, Annecy, France. Test Symposium (ETS), 2012 17th IEEE European, 2012, <a target="_blank" href="https://dx.doi.org/10.1109/ETS.2012.6233034">⟨10.1109/ETS.2012.6233034⟩</a>. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-00806793">⟨lirmm-00806793⟩</a> </div> |
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<h3 class="doc-header">Brevet<small class="doc-nb">2 documents</small></h3> |
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Aida Todri-Sanial, Reetu Raj Pandey, Jie Liang. Piezoelectric Biosensor. France, Patent n° : WO/2019/201956. 2019. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03023957">⟨lirmm-03023957⟩</a> </div> |
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Aida Todri-Sanial, Reetu Raj Pandey, Jie Liang. Piezoresistive Sensor Device with Amplification Module. France, Patent n° : WO/2019/201958. 2019. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03023943">⟨lirmm-03023943⟩</a> </div> |
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<h3 class="doc-header">Autre publication<small class="doc-nb">7 documents</small></h3> |
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<div class="doc-list" id="OTHER"> |
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Aida Todri-Sanial. NeurONN: des neurones oscillants pour une nouvelle architecture informatique. <i>Actualités de l’INS2I (Institut des sciences de l'information et de leurs interactions)</i>, 2020. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03027940">⟨lirmm-03027940⟩</a> </div> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03027963" target="_blank"> |
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Aida Todri-Sanial. NeurONN: des neurones oscillants pour une nouvelle architecture informatique. <i>Techno-Science.net</i>, 2020. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03027963">⟨lirmm-03027963⟩</a> </div> |
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Aida Todri-Sanial. Power of Electronics and People’s Will. 2020. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-03025347">⟨lirmm-03025347⟩</a> </div> |
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<a class="pull-left media-left" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02530086" target="_blank"> |
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Aida Todri-Sanial, Thierry Gil, Nadine Azemard, Jérémie Salles, Stefania Carapezzi, et al.. Two-Dimensional Oscillatory Neural Networks for Energy Efficient Neuromorphic Computing. <i>EU H2020 ICT NEURONN Research Project</i>, 2020. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02530086">⟨lirmm-02530086⟩</a> </div> |
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Aida Todri-Sanial. Heterogeneous Integration Roadmap (HIR): Co-Design Challenges and Perspectives. 2019. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02403741">⟨lirmm-02403741⟩</a> </div> |
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Aida Todri-Sanial. SmartVista Open Day Workshop. 2019. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02387989">⟨lirmm-02387989⟩</a> </div> |
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Aida Todri-Sanial. Quantum Computing - Collaborative Initiative between University of Montpellier and IBM Montpellier. 2019. <a target="_blank" href="https://hal-lirmm.ccsd.cnrs.fr/lirmm-02387996">⟨lirmm-02387996⟩</a> </div> |
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